Generating device for scan capture constraint and generating method thereof
AssigneesGlobal Unichip Corporation, Taiwan Semiconductor Manufacturing Company, Ltd.
InventorsChen-Yuan Kao, Yi-Hsuan Chiu
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AssigneesGlobal Unichip Corporation, Taiwan Semiconductor Manufacturing Company, Ltd.
InventorsChen-Yuan Kao, Yi-Hsuan Chiu
Estimating the term…
A generating device and a generating method for scan capture constraint are provided. The generating method for scan capture constraint includes: performing a clock mapping operation according to clock information, a netlist, and first function constraint information to generate a clock mapping report; performing a timing constraint generating operation according to the first function constraint information, the clock mapping report, and a wrapper cell report to generate scan timing constraint information; and performing an automatic test pattern generation constraint generating operation according to the scan timing constraint information, a hard macro instance list, and test mode configuration information to generate automatic test pattern constraint information.
A generating method for scan capture constraint, comprising:
A generating device for scan capture constraint, comprising:
Dependencies are inferred from the claim text.