Cluster Node Selection with Off-Band Metrics
AssigneeDell Products L.P.
InventorsSirisha Karnam, Charulata Ojha, Tamilarasan Janakiraman
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AssigneeDell Products L.P.
InventorsSirisha Karnam, Charulata Ojha, Tamilarasan Janakiraman
Estimating the term…
A system can determine respective on-band metrics for respective nodes of a group of nodes that are part of a computing cluster, wherein a first part of the group of nodes are active to the computing cluster, and wherein a second part of the group of nodes are inactive to the computing cluster. The system can determine respective off-band metrics for the respective nodes. The system can determine respective utilization scores of the respective nodes based on the respective on-band metrics. The system can determine respective reliability scores of the respective nodes based on the respective off-band metrics. The system can determine respective vulnerability scores of the respective nodes based on the respective on-band metrics. The system can modify a number of nodes of the first part of the group of nodes based on the respective utilization scores, the respective reliability scores, and the respective vulnerability scores.
A system, comprising:
A method, comprising:
A non-transitory computer-readable medium comprising instructions that, in response to execution, cause a system comprising at least one processor to perform operations, comprising:
Dependencies are inferred from the claim text.