Sulfonium salt, acid diffusion inhibitor, resist composition, and patterning process
AssigneeShin-Etsu Chemical Co., Ltd.
InventorsTakayuki FUJIWARA, Tomonari NOGUCHI, Junya KIMURA, Yutaro OTOMO
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AssigneeShin-Etsu Chemical Co., Ltd.
InventorsTakayuki FUJIWARA, Tomonari NOGUCHI, Junya KIMURA, Yutaro OTOMO
Estimating the term…
A sulfonium salt represented by the following general formula (1). In formula, R1, R2, and R3 represent a fluorine atom, a hydroxy group, a trifluoromethyl group, a trifluoromethoxy group, a cyano group, a carbamoyl group, an amide group, or a linear, branched, or cyclic monovalent hydrocarbon group having 1 to 15 carbon atoms and optionally having a heteroatom; “r” represents integer of 0 to 4, “p” represents integer of 0 to 5, “q” represents an integer of 0 to 5, “x” represents an integer of 0 to 4, “y” represents an integer of 0 to 5, “z” represents an integer of 0 to 5, and “r”, “p”, “q”, “x”, “y”, and “z” satisfy x+y+z≥1, 4≥r+x≥0, 5≥p+y≥0, and 5≥q+z≥0. This can provide an acid diffusion inhibitor used for a chemically-amplified resist material that does not cause impairing sensitivity in photolithography and is excellent in lithography performances such as CDU and LWR.
A sulfonium salt represented by the following general formula (1),
Dependencies are inferred from the claim text.