Spatial Phase Integrated Wafer-Level Imaging

A spatial phase integrated wafer-level imaging system comprising:

• an imaging wafer comprising an array of integrated image sensors, each integrated image sensor including:
• an array of radiation-sensing pixels configured to detect electromagnetic radiation;
• and
• a polarization structure disposed over the array of radiation-sensing pixels;
• wafer-level integrated optics stacked on the imaging wafer, the wafer-level integrated optics comprising an array of microlenses, wherein each microlens is positioned above a respective integrated image sensor and has at least one of a different focal length, pixel size, or integration time from at least one other microlens in the array of microlenses;
• and
• a processing wafer comprising edge processors configured to generate spatial phase data based on signals from the integrated image sensors.

A method of spatial phase integrated wafer-level imaging comprising:

• generating an image by operation of a spatial phase integrated wafer-level imaging system comprising:
• an imaging wafer comprising an array of integrated image sensors, each integrated image sensor including:
• an array of radiation-sensing pixels configured to detect electromagnetic radiation;
• and
• a polarization structure disposed over the array of radiation-sensing pixels;
• wafer-level integrated optics on the imaging wafer, the wafer-level integrated optics comprising an array of microlenses, wherein each microlens is positioned above a respective integrated image sensor and has different focal lengths, focal lengths, pixel size, or integration time from at least one other microlens in the array of microlenses;
• a processing wafer comprising edge processors, wherein generating the image comprises generating spatial phase data based on signals from the integrated image sensors using the edge processors.