Variable path length absorption spectrometer having automated continuous slope measurement
AssigneeRepligen Corporation
InventorsMatthew Muller, Richard Hall, III, Yusheng Zhang, Peter Halatin
Life of this patent
Estimating the term…
Loading patent…
AssigneeRepligen Corporation
InventorsMatthew Muller, Richard Hall, III, Yusheng Zhang, Peter Halatin
Estimating the term…
A system may include a light source, to generate a probe signal, comprising incident radiation; an optical probe, to direct the incident radiation through a fluid sample; a motor, to move the optical probe along a probe axis, to change a path length of the incident radiation through the fluid sample; and a detector, to receive the incident radiation as attenuated radiation after passing through the fluid sample. The system may include a control system, arranged to: initiate an absorbance measurement by directing movement of the optical probe along the probe axis; direct the light source to emit the incident radiation; and automatically adjust at least one measurement parameter of a set of measurement parameters for the sample measurement, based upon a slope parameter m, wherein m is derived from a rate of change in an intensity of the attenuated radiation with a change in the path length.
An absorbance measurement system, comprising:
A method of determining a concentration of a material in a fluid sample, comprising:
A non-transitory computer-readable storage medium storing computer-readable program code executable by a processor to:
Dependencies are inferred from the claim text.