Detection arrangement for an optical scanning microscope and optical scanning microscope
AssigneeLeica Microsystems CMS GmbH
InventorsLars FRIEDRICH, Christian SCHUMANN
Life of this patent
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AssigneeLeica Microsystems CMS GmbH
InventorsLars FRIEDRICH, Christian SCHUMANN
Estimating the term…
A detection arrangement for a microscope includes a beam splitter configured to split detection light into a first part and a second part, directed into a first beam path and a second beam path, respectively, a first dispersive element configured to spectrally separate the first part along a first direction, a first array detector configured to receive the spectrally separated first part, a second dispersive element configured to spectrally separate the second part along a second direction, and a second array detector configured to receive the spectrally separated second part. The beam splitter, the first dispersive element, and the second dispersive element are configured such that a first reference direction corresponding to the first direction imaged back to a plane arranged before the beam splitter and a second reference direction corresponding to the second direction imaged back to the plane are different from each other.
A detection arrangement for an optical scanning microscope, the detection arrangement comprising
Dependencies are inferred from the claim text.