Calibration plate for detecting a subsurface depth and preparation method therefor
AssigneeNational Institute of Metrology, China
InventorsShu ZHANG, Yushu SHI, Kang WANG, Lei PI
Life of this patent
Estimating the term…
Loading patent…
AssigneeNational Institute of Metrology, China
InventorsShu ZHANG, Yushu SHI, Kang WANG, Lei PI
Estimating the term…
A calibration plate for detecting a subsurface depth and a preparation method therefor are provided, relating to the field of optical calibration. The calibration plate includes wedged glass, sample particles, and a fixing device. The wedged glass includes a first side surface and a second side surface which are parallel to each other, a first planar surface and a second planar surface which are perpendicular to each other, and one inclined surface. The first side surface and the second side surface each are connected to the first planar surface, the second planar surface and the inclined surface. The inclined surface is connected to the first planar surface and the second planar surface; and the second planar surface is fixedly connected to the fixing device. The first planar surface is parallel to a horizontal plane, and the sample particles are uniformly attached to the inclined surface.
A calibration plate for detecting a subsurface depth, comprising:
Dependencies are inferred from the claim text.