Compensating for radiation damage in semiconductor-based radiation detectors
AssigneeKromek Limited
InventorEdward Marsden
Life of this patent
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Abstract
A method of compensating for high energy radiation damage to a semiconductor, in a semiconductor-based radiation detector, the method including: (a) detecting, using the detector, a radiation signal, wherein the detector comprises the semiconductor; (b) detecting, using a temperature sensor, a temperature of the detector; (c) detecting a leakage current in the detector; (d) determining a compensated leakage current based on the detected temperature; (e) determining a high energy radiation exposure based on the compensated leakage current; (f) determining, using the detected radiation signal, a compensated radiation signal based on the determined high energy radiation exposure; and (g) outputting the compensated radiation signal.
Claims13
A method of compensating for high energy radiation damage to a semiconductor, in a semiconductor-based radiation detector, the method comprising:
- a) detecting, using a detector, a radiation signal, wherein the detector comprises the semiconductor;
- b) detecting, using a temperature sensor, a temperature of the detector;
- c) detecting a leakage current, L, in the detector;
- d) determining a compensated leakage, L′, current based on the detected temperature;
- e) determining a high energy radiation exposure based on the compensated leakage current, L′;
- f) determining, using the detected radiation signal, a compensated radiation signal based on the determined high energy radiation exposure;
- and
- g) outputting the compensated radiation signal.
A semiconductor-based radiation detector system comprising:
- a semiconductor-based radiation detector;
- a compensation module configured to perform the steps of any preceding claim in response to and to compensate for high energy radiation damage to the semiconductor material of the semiconductor-based radiation detector.
Dependencies are inferred from the claim text.