Particle analysis device, particle analysis system, and particle analysis method

A particle analysis device comprising:

• acquiring circuitry to acquire a multi-viewpoint image obtained by synthesizing captured images of a lens array on which an image of light from a particle irradiated with light is formed via a main lens, the captured images being captured simultaneously from mutually different viewpoints by a plurality of cameras;
• sensing circuitry to sense a diffraction pattern of diffracted light diffracted by the particle on a basis of the multi-viewpoint image acquired by the acquiring circuitry;
• and
• calculating circuitry to calculate particle size of the particle on a basis of the diffraction pattern of the diffracted light sensed by the sensing circuitry.

A particle analysis method comprising:

• acquiring a multi-viewpoint image obtained by synthesizing captured images of a lens array on which an image of light from a particle irradiated with light is formed via a main lens, the captured images being captured simultaneously from mutually different viewpoints by a plurality of cameras;
• sensing a light intensity pattern of scattered light scattered from the particle on a basis of the multi-viewpoint image acquired;
• analyzing a scattering solid angle of scattered light relative to an optical axis of the main lens as a center on a basis of the light intensity pattern of the scattered light sensed;
• and
• calculating a molecular weight and particle size of the particle on a basis of the scattering solid angle of the scattered light analyzed.

A particle analysis method comprising:

• acquiring a multi-viewpoint image obtained by synthesizing captured images of a lens array on which an image of light from a particle irradiated with light is formed via a main lens, the captured images being captured simultaneously from mutually different viewpoints by a plurality of cameras;
• sensing a diffraction pattern of diffracted light diffracted by the particle on a basis of the multi-viewpoint image acquired;
• and
• calculating particle size of the particle on a basis of the diffraction pattern of the diffracted light sensed.