Bond-degradation device for testing emi/lightning susceptibility and emission suppression

A method for testing EMI susceptibility of an electrical control system that includes a shielded cable assembly, the method comprising:

• disconnecting normally-connected first and second shielded connectors of the electrical control system;
• connecting a first complementary mating connector of a bond-degradation testing device to the second shielded connector of the electrical control system, thereby connecting a plurality of contacts surrounded by a conductive backshell of the first complementary mating connector of the bond-degradation testing device with a plurality of contacts and a conductive backshell-connecting member, respectively, of the second shielded connector of the electrical control system;
• connecting a second complementary mating connector of a bond-degradation testing device to the first shielded connector of the electrical control system, thereby connecting a plurality of contacts surrounded by a conductive backshell-connecting member of the second complementary mating connector of the bond-degradation testing device with a plurality of contacts and a conductive backshell, respectively, of the first shielded connector of the electrical control system,
• wherein the bond-degradation testing device includes:
• a plurality of conductive wires that extend between and connect corresponding ones of the pluralities of contacts of the first and second complementary mating connectors;
• and
• a conductive shield that surrounds the plurality of wires and conductively couple to backshell of the first complementary mating connector and the backshell-connecting member of the second complementary mating connector;
• a resistive annulus interposed between the backshell of the first complementary mating connector and the backshell-connecting member of the second complementary mating connectors, thereby compromising integrity of the shielding of conductive wires within the shielding of the shielded cable assembly by increasing loop resistance of the shielding;
• and
• testing EMI susceptibility or emission suppression of the electrical control system.