Depth data measuring head, measuring apparatus, and measuring method

A depth data measuring device, comprising:

• a depth data measuring head, comprising:
• a projection device for projecting linear light that moves in a first direction to an imaging area, wherein the length of the linear light is in a second direction perpendicular to the first direction;
• an image sensor including N memory cell sets, each memory cell set exposed in an exposure switch cycle te that is phase-shifted by 2π/N relative to each other, where N is an integer greater than 1,
• wherein the projection device completes a single pattern scan within a scanning cycle , which includes multiple repeating subcycles , in each subcycle , the linear light changes brightness with a projection cycle tp, which has the same duration as the exposure switch cycle te, the projection cycle tp includes N waveform projection areas, each with a width of 2π/N, where the light intensity in each waveform projection area is encoded such that when a single pattern scan is completed within the scanning cycle , the N memory cell sets in the image sensor each capture a different striped-light pattern, the N striped-light patterns form a set of N-step phase-shifted patterns, each having a phase-shifted of 2π/N relative to the others;
• and
• a processor connected to the depth data measuring head, configured to obtain one depth map of the imaging area from the obtained N striped-light patterns when completing a single pattern scan within the scanning cycle .

A depth data measuring method, comprising:

• projecting linear light that moves in a first direction to an imaging area, wherein the length of the linear light is in a second direction perpendicular to the first direction, linear light projection completes a single pattern scan in one scanning cycle , which includes multiple repeating subcycles , in each subcycle , the linear light changes brightness with a projection cycle tp, which has the same duration as the exposure switch cycle te, the projection cycle tp includes N waveform projection areas, each with a width of 2π/N, where the light intensity in each waveform projection area is encoded, where N is an integer greater than 1;
• capturing the imaging area using an image sensor including N memory cell sets to obtain N image frames under the linear light scanning projection, each memory cell set exposed in an exposure switch cycle te that is phase-shifted by 2π/N relative to each other;
• and
• obtaining depth data of the object to be measured in the imaging area based on the image frames,
• wherein the light intensity in each waveform projection area is encoded such that when a single pattern scan is completed within the scanning cycle , the N memory cell sets in the image sensor each capture a different striped-light pattern, the N striped-light patterns form a set of N-step phase-shifted patterns, each having a phase-shifted of 2π/N relative to the others.