Inspection device
AssigneeRayleigh Vision Limited
InventorsJr-Hau He, Der-Hsien Lien, Zhi-Ting Ye
Life of this patent
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AssigneeRayleigh Vision Limited
InventorsJr-Hau He, Der-Hsien Lien, Zhi-Ting Ye
Estimating the term…
The present invention provides an inspection device. A light source emits a mixed light beam to an object to enable photoluminescence of the object and generating an inspection light beam. After the inspection light beam passes through one of a plurality of filters, it is emitted to a beam splitter. A part of the inspection light beam is emitted to a shortwave filter while the other part is emitted to a longwave filter. The shortwave filter filters out the shortwaves of the first split light beam and the filtered first split light beam is emitted to a first sensing element. The longwave filter filters out the longwaves of the second split light beam and the filtered second split light beam is emitted to a second sensing element. The filter conversion module uses a conversion structure to alter the plurality of filters.
An inspection device, using to inspect an object, comprising:
Dependencies are inferred from the claim text.