System and Method to Control Particle Deposition on a Filter Membrane
AssigneeSkc Co., Ltd.
InventorSaulius Trakumas
Life of this patent
Estimating the term…
Abstract
Embodiments relate to a sampler component. The sampler component includes a chamber configured to allow fluid to flow there-through, a filter configured to remove particles or contaminants from the fluid as it passes through the chamber and capture said particles or contaminants on the filter, and a apertured-member including at least one aperture. The apertured-member has zero-or low-fluid permeability to prevent the flow of fluid there-through. Fluid freely passes through the at least one aperture and particles or contaminants are deposited on the filter in the area of the at least one aperture.
Claims15
A sampler component, comprising:
- a chamber configured to allow fluid to flow there-through;
- a filter configured to remove particles or contaminants from the fluid as it passes through the chamber and capture said particles or contaminants on the filter;
- a apertured-member including at least one aperture, wherein:
- the apertured-member has zero-or low-fluid permeability to prevent the flow of fluid there-through;
- and
- fluid freely passes through the at least one aperture and particles or contaminants are deposited on the filter in the area of the at least one aperture.
A method of capturing particles or contaminants, the method comprising:
- causing or allowing a fluid to flow through a sampler structure, wherein:
- the sampler structure includes a filter configured to remove particles or contaminants from the fluid as it flows through the sampler structure and capture said particles or contaminants on the filter;
- the sampler structure includes a apertured-member having at least one aperture, wherein:
- the apertured-member has zero-or low-fluid permeability to prevent the flow of fluid there-through;
- and
- fluid freely passes through the at least one aperture and particles or contaminants are deposited on the filter in the area of the at least one aperture;
- a region of the filter adjacent the at least one aperture is a filter-aperture region, and a region of the filter adjacent non-apertured portions of the apertured-member is a filter-member region;
- wherein:
- particles or contaminants are captured on the filter in the filter-aperture region at a concentration that is greater than particles or contaminants captured on the filter in the filter-member region;
- and/or
- particles or contaminants are captured on the filter in the filter-aperture region at a rate that is greater than particles or contaminants captured on the filter in the filter-member region.
Dependencies are inferred from the claim text.