# US 2025/0210331 A1 · Plasma processing apparatus > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2025/0210331 A1 - Document ID: US20250210331A1 - Status: Published application - Kind: A1 - Application number: 19/077,072 - Filed: 2025-03-12 - Published: 2025-06-26 - Earliest claimed: 2023-11-17 - Assignees: Tokyo Electron Limited - Applicants: Tokyo Electron Limited - Inventors: Takumi IMAHASHI; Manabu ISHIKAWA; Yuki KUMAGAI; Hiroki SATO; Yuki KAWADA; Koji YAMAGISHI - Web page: https://patentgrep.com/patent/US20250210331A1 ## CPC - H01J 37/32935: {Monitoring and controlling tubes by information coming from the object and/or discharge} - H01J 37/32165: {Plural frequencies} - H01J 37/32174: {Circuits specially adapted for controlling the RF discharge} - H01J 37/32183: {Matching circuits} - H01J 37/32568: {Relative arrangement or disposition of electrodes; moving means} - H01J 37/32642: {Focus rings} - H01J 37/32715: {Workpiece holder} - H05H 1/46: using applied electromagnetic fields, e.g. high frequency or microwave energy (H05H1/26 takes precedence) - H10P 50/242: {of Group IV materials} - H01J 2237/3343: Problems associated with etching - H01J: ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; electric arc lamps H05B31/00; particle accelerators H05H) - H05H: PLASMA TECHNIQUE (apparatus or processes specially adapted for producing X-rays H05G2/00); PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS - H10P: GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10 ## Abstract A plasma processing apparatus comprises: a chamber; first and second bias power sources for supplying first and second bias signals; a substrate supporter for supporting a substrate and an edge ring, inside the chamber; an impedance adjustment mechanism; and an electrical path. The substrate supporter includes: first and second regions supporting the substrate and the edge ring, first and second bias electrodes in the first and second regions, and an impedance adjustment electrode provided in the second region and grounded. The impedance adjustment mechanism includes: a first impedance adjustment mechanism controlling the first bias signal. An isolator and the first impedance adjustment mechanism, and the second impedance adjustment mechanism are connected in parallel, and are connected to the impedance adjustment electrode. The electrical path is configured to connect the first bias power source and the second bias power source, to the first bias electrode and the second bias electrode. ## Claims ### Claim 1 A plasma processing apparatus comprising: a chamber; a first bias power source configured to supply a first bias signal; a second bias power source configured to supply a second bias signal; a substrate supporter for supporting a substrate and an edge ring, inside the chamber; an impedance adjustment mechanism; and an electrical path, wherein the substrate supporter is configured to include: a first region supporting the substrate, a second region provided around the first region and supporting the edge ring, a first bias electrode provided in the first region, a second bias electrode provided in the second region, and an impedance adjustment electrode provided in the second region and grounded, and wherein the impedance adjustment mechanism includes: a first impedance adjustment mechanism controlling the first bias signal, an isolator connected between the impedance adjustment electrode and the first impedance adjustment mechanism and blocking the second bias signal, and a second impedance adjustment mechanism controlling the second bias signal, wherein the isolator and the first impedance adjustment mechanism, and the second impedance adjustment mechanism are connected in parallel, and are configured to be connected to the impedance adjustment electrode, and the electrical path is configured to connect the first bias power source and the second bias power source, to the first bias electrode and the second bias electrode. ### Claim 2 (depends on 1) The plasma processing apparatus of claim 1, wherein the electrical path is provided with a switch between the first bias power source and the second bias power source, and the second bias electrode, the switch is controlled to be turned on when the first bias signal is supplied, and the switch is controlled to be turned off when the second bias signal is supplied. ### Claim 3 (depends on 1) The plasma processing apparatus of claim 1, wherein the first impedance adjustment mechanism is configured to include at least one of a variable resistor, a variable capacitor, and a variable inductor, and the second impedance adjustment mechanism is configured to include at least one of the variable resistor, the variable capacitor, and the variable inductor. ### Claim 4 (depends on 3) The plasma processing apparatus of claim 3, wherein a frequency of the first bias signal is lower than a frequency of the second bias signal, the first impedance adjustment mechanism is configured to include a first variable capacitor, the second impedance adjustment mechanism is configured to include a second variable capacitor, and a variable range of capacitance of the first variable capacitor is larger than a variable range of capacitance of the second variable capacitor. ### Claim 5 (depends on 1) The plasma processing apparatus of claim 1, wherein the isolator includes a resonant circuit having a resonant frequency that is a frequency of the second bias signal. ### Claim 6 A plasma processing apparatus comprising: a chamber; a first bias power source configured to supply a first bias signal; a second bias power source configured to supply a second bias signal; a substrate supporter for supporting a substrate and an edge ring, inside the chamber; an impedance adjustment mechanism; and an electrical path, wherein the substrate supporter is configured to include: a first region supporting the substrate, a second region provided around the first region and supporting the edge ring, a first bias electrode provided in the first region, a second bias electrode provided in the second region, and an impedance adjustment electrode provided in the second region and grounded, and wherein the impedance adjustment mechanism is configured to be connected to the impedance adjustment electrode, and the electrical path is configured to connect the first bias power source and the second bias power source, to the first bias electrode and the second bias electrode, and a switch is provided between the first bias power source and the second bias power source, and the second bias electrode, and the switch is controlled to be turned on when the first bias signal is supplied, and the switch is controlled to be turned off when the second bias signal is supplied. ### Claim 7 (depends on 6) The plasma processing apparatus of claim 6, wherein the impedance adjustment mechanism includes: a first impedance adjustment mechanism controlling the first bias signal, an isolator connected between the impedance adjustment electrode and the first impedance adjustment mechanism and blocking the second bias signal, and a second impedance adjustment mechanism controlling the second bias signal, and wherein the isolator and the first impedance adjustment mechanism are connected in parallel with the second impedance adjustment mechanism. ### Claim 8 (depends on 7) The plasma processing apparatus of claim 7, wherein the first impedance adjustment mechanism is configured to include at least one of a variable resistor, a variable capacitor, and a variable inductor, and the second impedance adjustment mechanism is configured to include at least one of a variable resistor, a variable capacitor, and a variable inductor. ### Claim 9 (depends on 1) The plasma processing apparatus of claim 1, wherein a frequency of the first bias signal is lower than a frequency of the second bias signal. ### Claim 10 (depends on 1) The plasma processing apparatus of claim 1, wherein the impedance adjustment mechanism is adjusted from low impedance to high impedance in response to an increase in erosion amount of the edge ring. ### Claim 11 (depends on 1) The plasma processing apparatus of claim 1, wherein the impedance adjustment mechanism is connected to the impedance adjustment electrode through a conductive bar, the conductive bar is arranged along an inner peripheral side of the second region, and includes a first connection portion connected to the impedance adjustment mechanism and a second connection portion connected to the impedance adjustment electrode, and the first connection portion and the second connection portion are adjacent to each other in a circumferential direction with an unconnected portion in the circumferential direction between the first connection portion and the second connection portion. ### Claim 12 (depends on 11) The plasma processing apparatus of claim 11, wherein the conductive bar is disposed below a base of the substrate support, and functions as a split ring resonator. ### Claim 13 (depends on 12) The plasma processing apparatus of claim 12, wherein a resonant frequency of the split ring resonator is a frequency of the second bias signal. ### Claim 14 (depends on 1) The plasma processing apparatus of claim 1, wherein the impedance adjustment mechanism is connected to a plurality of the impedance adjustment electrodes through a conductive bar, the conductive bar includes a first conductive bar arranged in a circumferential direction along an inner peripheral side of the second region, and a plurality of second conductive bars arranged from the first conductive bar toward a center of a base of the substrate support, each of the plurality of second conductive bars has a first connection portion connected to the impedance adjustment mechanism, and the first conductive bar has a plurality of second connection portions connected to a plurality of the impedance adjustment electrodes at connection portions connected to the plurality of second conductive bars. ### Claim 15 (depends on 1) The plasma processing apparatus of claim 1, wherein the impedance adjustment mechanism is connected to the impedance adjustment electrode through a conductive bar, and the conductive bar is arranged along the second region to have multiple turns. ### Claim 16 (depends on 1) The plasma processing apparatus of claim 1, further comprising: a measurement section configured to measure a voltage and a current of a bias RF signal output from at least one of the first bias power source and the second bias power source, wherein the bias power source is configured to control power of the bias RF signal such that a potential of the first bias electrode and the second bias electrode becomes a preset setting value, based on the voltage and the current which are measured by the measurement section when the impedance adjustment mechanism is adjusted. ### Claim 17 (depends on 1) The plasma processing apparatus of claim 1, further comprising: a measurement section configured to measure a voltage and a current of a bias DC signal output from at least one of the first bias power source and the second bias power source, wherein the bias power source is configured to control power of the bias DC signal such that power supplied to the first bias electrode and the second bias electrode becomes a preset setting value, based on the voltage and the current which are measured in the measurement section when the impedance adjustment mechanism is adjusted. ### Claim 18 (depends on 6) The plasma processing apparatus of claim 6, wherein a frequency of the first bias signal is lower than a frequency of the second bias signal. ### Claim 19 (depends on 6) The plasma processing apparatus of claim 6, wherein the impedance adjustment mechanism is adjusted from low impedance to high impedance in response to an increase in erosion amount of the edge ring. ### Claim 20 (depends on 6) The plasma processing apparatus of claim 6, wherein the impedance adjustment mechanism is connected to the impedance adjustment electrode through a conductive bar, the conductive bar is arranged along an inner peripheral side of the second region, and includes a first connection portion connected to the impedance adjustment mechanism and a second connection portion connected to the impedance adjustment electrode, and the first connection portion and the second connection portion are adjacent to each other in a circumferential direction with an unconnected portion in the circumferential direction between the first connection portion and the second connection portion. ### Claim 21 (depends on 6) The plasma processing apparatus of claim 6, wherein the impedance adjustment mechanism is connected to a plurality of the impedance adjustment electrodes through a conductive bar, the conductive bar includes a first conductive bar arranged in a circumferential direction along an inner peripheral side of the second region, and a plurality of second conductive bars arranged from the first conductive bar toward a center of a base of the substrate support, each of the plurality of second conductive bars has a first connection portion connected to the impedance adjustment mechanism, and the first conductive bar has a plurality of second connection portions connected to a plurality of the impedance adjustment electrodes at connection portions connected to the plurality of second conductive bars. ### Claim 22 (depends on 6) The plasma processing apparatus of claim 6, wherein the impedance adjustment mechanism is connected to the impedance adjustment electrode through a conductive bar, and the conductive bar is arranged along the second region to have multiple turns. ### Claim 23 (depends on 6) The plasma processing apparatus of claim 6, further comprising: a measurement section configured to measure a voltage and a current of a bias RF signal output from at least one of the first bias power source and the second bias power source, wherein the bias power source is configured to control power of the bias RF signal such that a potential of the first bias electrode and the second bias electrode becomes a preset setting value, based on the voltage and the current which are measured by the measurement section when the impedance adjustment mechanism is adjusted. ### Claim 24 (depends on 6) The plasma processing apparatus of claim 6, further comprising: a measurement section configured to measure a voltage and a current of a bias DC signal output from at least one of the first bias power source and the second bias power source, wherein the bias power source is configured to control power of the bias DC signal such that power supplied to the first bias electrode and the second bias electrode becomes a preset setting value, based on the voltage and the current which are measured in the measurement section when the impedance adjustment mechanism is adjusted.