Device for electrode plate testing
AssigneeContemporary Amperex Technology (Hong Kong) Limited
InventorsBingyang Zhan, Jingdong Zhang, Weigang Chen, Zhihui Zhen, Qiangjun Wang, Liangjie Yan, Qian Wu
Life of this patent
Estimating the term…
Loading patent…
AssigneeContemporary Amperex Technology (Hong Kong) Limited
InventorsBingyang Zhan, Jingdong Zhang, Weigang Chen, Zhihui Zhen, Qiangjun Wang, Liangjie Yan, Qian Wu
Estimating the term…
This application provides a device for electrode plate testing that can effectively perform full-zone areal density testing on an electrode plate material. The device includes: a radiation mechanism, the radiation mechanism being configured to emit a ray to an electrode plate, where the ray is set along a width direction of the electrode plate to cover the electrode plate, and scan the electrode plate along a length direction of the electrode plate; and a probe mechanism, the probe mechanism and the radiation mechanism being disposed opposite on two sides of the electrode plate, where the probe mechanism is configured to monitor a signal transmitted through the electrode plate, and the signal is used to test areal density of a material applied on a surface of the electrode plate.
A device for electrode plate testing, characterized in that the device comprises:
Dependencies are inferred from the claim text.