Pixel-based rule check for layouts
AssigneeD2S, Inc.
InventorsMariusz A. Niewczas, Yefim G. Belenky, Abhishek Shendre, Michael Pomerantsev, Akira Fujimura
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AssigneeD2S, Inc.
InventorsMariusz A. Niewczas, Yefim G. Belenky, Abhishek Shendre, Michael Pomerantsev, Akira Fujimura
Estimating the term…
Some embodiments provide a method for performing pixel-based rule checking on a layout that is used in a process for designing or manufacturing an integrated circuit. This pixel-based method provides an optimal approach for performing rule checks for layouts having shapes with curvilinear contours (i.e., with curvilinear edges). This method in some embodiments performs the rule check on a per pixel-basis that is optimal for curvilinear edges on which one or more pixels reside. In some embodiments, the layout is a mask layout used to manufacture the IC, while in other embodiments, the layout is a design layout used to design the IC (e.g., a layout used during the physical design process).
A method for performing rule checks on a set of shapes in a layout used for designing or manufacturing components on a substrate, the method comprising:
A non-transitory machine readable medium storing a program for execution by at least one processing unit and for performing rule checks on a set of shapes in a layout used for designing or manufacturing components on a substrate, the program comprising sets of instructions for:
Dependencies are inferred from the claim text.