Intensity measuring device, intensity measuring system, and intensity measuring method

An intensity measuring device that is connected to a sensor device that outputs a signal waveform related to an elastic wave generated by shot processing and measures an intensity of the shot processing based on the signal waveform, the intensity measuring device comprising:

• a waveform acquisition unit configured to acquire the signal waveform from the sensor device;
• and
• an output unit configured to output the intensity of the shot processing based on the signal waveform, wherein
• the intensity y output from the output unit satisfies the following Equation (2),
• [
• Equation
• ⁢
• 2
• ]
• y
• =
• ∑
• k
• =
• 0
• n
• a
• k
• ⁢
• x
• k
• (
• 2
• )
• where, ak is a constant, and x is an average value of effective values of the signal waveform for a predetermined time length.

An intensity measuring system comprising:

• a sensor device configured to output a signal waveform related to an elastic wave generated by shot processing;
• a waveform acquisition unit configured to acquire the signal waveform from the sensor device;
• a time-series data generation unit configured to generate time-series data of an effective value of the signal waveform;
• an average value acquisition unit configured to obtain an average value of the effective values for a predetermined time length based on the time-series data;
• and
• an intensity acquisition unit configured to obtain an intensity of the shot processing based on the average value of the effective values.

An intensity measuring method comprising:

• acquiring a signal waveform related to an elastic wave generated by shot processing from a sensor device;
• generating time-series data of an effective value of the signal waveform;
• obtaining an average value of the effective values for a predetermined time length based on the time-series data;
• and
• obtaining an intensity of the shot processing based on the average value of the effective values.