Film and laminate

A film comprising:

• a layer A;
• and
• a layer B on at least one surface of the layer A,
• wherein a dielectric loss tangent is 0.01 or less, and
• an ion intensity derived from a fluorine atom or a silicone structure, which is measured by time-of-flight secondary ion mass spectrometry, on a surface of the layer B on a side opposite to a layer A side, is larger than an ion intensity derived from a fluorine atom or a silicone structure, which is measured by time-of-flight secondary ion mass spectrometry, inside the layer B.

A laminate comprising, in the following order:

• a layer A;
• a layer B;
• and
• a metal layer or a metal wire,
• wherein a dielectric loss tangent is 0.01 or less, and
• a surface free energy on a surface of the layer B on a side opposite to a layer A side is 30 mJ/m2 or less.

A laminate comprising, in the following order:

• a layer A;
• a layer B;
• and
• a metal layer or a metal wire,
• wherein a dielectric loss tangent is 0.01 or less, and
• an ion intensity derived from a fluorine atom or a silicone structure, which is measured by time-of-flight secondary ion mass spectrometry, on a surface of the layer B on a side opposite to a layer A side, is larger than an ion intensity derived from a fluorine atom or a silicone structure, which is measured by time-of-flight secondary ion mass spectrometry, inside the layer B.