# US 2025/0164409 A1 · Systems and Methods for Detection of Defects in Machine Surfaces > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2025/0164409 A1 - Document ID: US20250164409A1 - Status: Published application - Kind: A1 - Application number: 18/841,034 - Filed: 2023-03-01 - Published: 2025-05-22 - Earliest claimed: 2022-03-01 - Applicants: Matthews International Corporation; Matthews International GmbH - Inventors: Thomas HACKFORT; Carsten KLEINGRIES - Web page: https://patentgrep.com/patent/US20250164409A1 ## CPC - G01N 21/8851: {Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges (G01N21/8806 and G01N21/93 - G01N21/95692 take precedence; optical measurement of dimensions G01B11/00; optical scanning G02B26/10; image transformation G06T3/00; computerised image enhancement G06T5/00; image processing per se for flaw detection G06T7/0002)} - G01N 21/892: characterised by the flaw, defect or object feature examined - G01N 21/952: Inspecting the exterior surface of cylindrical bodies or wires (G01N21/956 takes precedence) - G01N 21/89: in moving material, e.g. running paper or textiles (G01N21/90, G01N21/91, G01N21/94 take precedence) - G01N 2021/8861: {Determining coordinates of flaws} - G01N 2021/8887: {based on image processing techniques} - G01N 2021/8893: {providing a video image and a processed signal for helping visual decision} - G01N 2021/8918: {Metal} - G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q) ## Abstract Systems and methods for identifying defects in manufacturing equipment are described. Camera-based image analysis can be used to improve product quality and reliability. Imagery of a machine surface can be repeatedly captured and analyzed by a processing device. Machine surfaces can be etched with landmarks to aid in removing distortion in imagery collected from the surfaces. ## Claims ### Claim 1 A system to detect defects in a machine surface used to produce an electrode, the system comprising: at least one camera; and at least one processing device configured to detect a presence or absence of one or more defects in the machine surface using image input from the at least one camera. ### Claim 2 (depends on 1) The system of claim 1, wherein the at least one camera comprises two or more cameras. ### Claim 3 (depends on 1) The system of claim 1, wherein the at least one camera is an optical camera. ### Claim 4 (depends on 1) The system of claim 1, wherein the at least one camera has a resolution of at least about 0.5 mm. ### Claim 5 (depends on 1) The system of claim 1, wherein the at least one camera is configured to capture image input periodically. ### Claim 6 (depends on 1) The system of claim 1, wherein the at least one camera is configured to capture image input based on external input comprising at least one of sensor input and user input. ### Claim 7 (depends on 1) The system of claim 1, wherein the at least one camera is configured to transmit the image input to the at least one processing device wirelessly. ### Claim 8 (depends on 1) The system of claim 1, wherein the at least one processing device is further configured to receive and analyze the image input to detect the presence or absence of one or more defects in the machine surface. ### Claim 9 (depends on 1) The system of claim 1, wherein the at least one processing device is further configured to output a report or signal based on the presence of defects in the machine surface. ### Claim 10 (depends on 1) The system of claim 1, wherein the at least one processing device is further configured to count defects in the machine surface. ### Claim 11 (depends on 1) The system of claim 1, wherein the at least one processing device is further configured to determine a physical location of defects in the machine surface. ### Claim 12 A method of detecting a presence of defects in a machine surface used to produce an electrode, the method comprising: providing at least one machine surface used to produce an electrode; obtaining at least one image of the machine surface using at least one camera; and analyzing the image using at least one processing device to detect the presence of the defects. ### Claim 13 (depends on 12) The method of claim 12, further comprising obtaining the at least one image periodically. ### Claim 14 (depends on 12) The method of claim 12, further comprising obtaining the at least one image based on external input comprising at least one of sensor input and user input. ### Claim 15 (depends on 13) The method of claim 13, wherein the analyzing is qualitative. ### Claim 16 (depends on 13) The method of claim 13, wherein the analyzing is quantitative. ### Claim 17 (depends on 13) The method of claim 13, further comprising determining whether the presence of defects is acceptable. ### Claim 18 (depends on 13) The method of claim 13, further comprising determining a physical location of defects in the machine surface. ### Claim 19 (depends on 13) The method of claim 13, further comprising applying a fluid to the machine surface before obtaining the at least one image.