Methods and apparatus to trim temperature sensors
AssigneeTexas Instruments Incorporated
InventorNathan Richard Schemm
Life of this patent
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Abstract
Methods, apparatus, systems and articles of manufacture to trim temperature sensors are disclosed. An example method includes: sampling a first value indicative of a temperature of a first die of a multi-chip module (MCM) with a first temperature sensor, the first die including a first transistor having a channel including a first material; and calibrating a second temperature sensor configured to sample a second value indicative of a temperature of a second die including a second transistor have a second channel including a second material, the calibrating based on the first value.
Claims20
A method comprising:
- sampling a first value indicative of a temperature of a first die of a multi-chip module (MCM) with a first temperature sensor, the first die including a first transistor having a channel including a first material;
- and
- calibrating a second temperature sensor configured to sample a second value indicative of a temperature of a second die including a second transistor have a second channel including a second material, the calibrating based on the first value.
A method comprising:
- calibrating a first temperature sensor with a first temperature;
- measuring, with the first temperature sensor, a second temperature of a package, wherein the package includes a first die and a second die;
- and
- calibrating a second temperature sensor with the first temperature, wherein the first temperature sensor and the second temperature sensor are included in the first die, and wherein the second die includes a temperature indicator coupled to the second temperature sensor.
A method comprising:
- receiving, by a first calibrator, a first calibration adjustment;
- receiving, by a second calibrator, a second calibration adjustment;
- receiving, by a first temperature sensor, a first temperature and the first calibration adjustment;
- receiving, by a second temperature sensor, a second temperature and the second calibration adjustment;
- in response to the second temperature having a value outside a reference voltage value, adjusting, by the second temperature sensor, a conduction of transistors;
- and
- outputting, by the second temperature sensor, a voltage.
Dependencies are inferred from the claim text.