# US 2025/0147500 A1 · Abnormality detection apparatus, abnormality detection method, and computer readable medium > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2025/0147500 A1 - Document ID: US20250147500A1 - Status: Published application - Kind: A1 - Application number: 19/014,499 - Filed: 2025-01-09 - Published: 2025-05-08 - Earliest claimed: 2022-09-02 - Assignees: Mitsubishi Electric Corporation - Applicants: Mitsubishi Electric Corporation - Inventors: Kohei KUWAJIMA; Masashi TATEDOKO - Web page: https://patentgrep.com/patent/US20250147500A1 ## CPC - G05B 23/0221: {Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods} - G05B 23/02: Electric testing or monitoring - G05B 23/024: {Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks} - G05B 23/0254: {based on a quantitative model, e.g. mathematical relationships between inputs and outputs; functions: observer, Kalman filter, residual calculation, Neural Networks} - G05B: CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS (systems for controlling or regulating non-electric variables G05D; systems for regulating electric or magnetic variables G05F; control devices or systems insofar as characterised by mechanical features only G05G) ## Abstract An abnormality detection apparatus (100) detects an abnormality of a facility. A model generation unit (110) extracts a feature amount of control signal time series data (143) as training data, and generates a control signal model (144) that outputs an abnormality degree for each control signal from the time series data of the control signal based on the training data. A reliability calculation unit (120) calculates the reliability of the control signal in a specific time range by inputting to the control signal model (144), the time series data of the control signal in the specific time range of an abnormality detection result detected in a sensor signal, as verification data. An abnormality diagnosis unit (130) outputs information in which the reliability of the control signal in the specific time range is added to the abnormality detection result in the specific time range, as an abnormality diagnosis result (146). ## Claims ### Claim 1 An abnormality detection apparatus that includes a sensor and detects an abnormality of a facility controlled by a control signal, the abnormality detection apparatus comprising: processing circuitry: to obtain an abnormality degree of a control signal in a specific time range by inputting to a control signal model which is a model that is generated based on training data which is a feature amount of time series data of a past control signal and outputs the abnormality degree for each control signal from the time series data of the control signal, the time series data of the control signal in the specific time range of an abnormality detection result detected in a sensor signal obtained from the sensor, as verification data, and to calculate the reliability of the control signal in the specific time range and; to output information in which the reliability of the control signal in the specific time range is added to the abnormality detection result in the specific time range, as an abnormality diagnosis result. ### Claim 2 (depends on 1) The abnormality detection apparatus according to claim 1, wherein the processing circuitry extracts the feature amount of the time series data of the past control signal, as the training data, and generates the control signal model based on the training data. ### Claim 3 (depends on 2) The abnormality detection apparatus according to claim 2, wherein the processing circuitry decides an abnormality detection technique to be applied to each control signal set in correspondence information, based on the correspondence information in which the sensor signal and the control signal that affects the sensor signal are corresponded to each other, abnormality detection technique information in which the sensor signal, the abnormality detection technique to be applied to the sensor signal, and a data format of the sensor signal to be input to the abnormality detection technique are set, and the time series data of the control signal, generates the training data to be input to the abnormality detection technique by replacing the data format of the sensor signal to be input to the abnormality detection technique with a data format of the control signal, and generates the control signal model by inputting the training data to the abnormality detection technique. ### Claim 4 (depends on 3) The abnormality detection apparatus according to claim 3, wherein the processing circuitry generates from the time series data of the control signal, the verification data based on the correspondence information, the abnormality detection technique information, the control signal model, the time series data of the control signal, and the abnormality detection result in the specific time range, and obtains the abnormality degree of the control signal by inputting the verification data to the control signal model. ### Claim 5 (depends on 3) The abnormality detection apparatus according to claim 3, wherein when one sensor signal and a combination of control signals are corresponded to each other and a commination method of the combination of control signals is also set in the correspondence information, the processing circuitry generates the control signal model by applying to each of the combination of control signals, the abnormality detection technique corresponding to the sensor signal, and the processing circuitry calculates the reliability of the combination of control signals, using the combination method of the combination of control signals. ### Claim 6 (depends on 4) The abnormality detection apparatus according to claim 4, wherein when one sensor signal and a combination of control signals are corresponded to each other and a commination method of the combination of control signals is also set in the correspondence information, the processing circuitry generates the control signal model by applying to each of the combination of control signals, the abnormality detection technique corresponding to the sensor signal, and the processing circuitry calculates the reliability of the combination of control signals, using the combination method of the combination of control signals. ### Claim 7 (depends on 2) The abnormality detection apparatus according to claim 2, wherein the processing circuitry divides the time series data of the control signal for each control state based on event signal information that stores log data of an event signal that represents a control state or an alert of the facility, and the processing circuitry generates the control signal model from the time series data of the control signal for each mode. ### Claim 8 (depends on 3) The abnormality detection apparatus according to claim 3, wherein the processing circuitry divides the time series data of the control signal for each control state based on event signal information that stores log data of an event signal that represents a control state or an alert of the facility, and the processing circuitry generates the control signal model from the time series data of the control signal for each mode. ### Claim 9 (depends on 4) The abnormality detection apparatus according to claim 4, wherein the processing circuitry divides the time series data of the control signal for each control state based on event signal information that stores log data of an event signal that represents a control state or an alert of the facility, and the processing circuitry generates the control signal model from the time series data of the control signal for each mode. ### Claim 10 (depends on 5) The abnormality detection apparatus according to claim 5, wherein the processing circuitry divides the time series data of the control signal for each control state based on event signal information that stores log data of an event signal that represents a control state or an alert of the facility, and the processing circuitry generates the control signal model from the time series data of the control signal for each mode. ### Claim 11 (depends on 6) The abnormality detection apparatus according to claim 6, wherein the processing circuitry divides the time series data of the control signal for each control state based on event signal information that stores log data of an event signal that represents a control state or an alert of the facility, and the processing circuitry generates the control signal model from the time series data of the control signal for each mode. ### Claim 12 An abnormality detection method used for an abnormality detection apparatus that includes a sensor and detects an abnormality of a facility controlled by a control signal, the abnormality detection method comprising: obtaining an abnormality degree of a control signal in a specific time range by inputting to a control signal model which is a model that is generated based on training data which is a feature amount of time series data of a past control signal and outputs the abnormality degree for each control signal from the time series data of the control signal, the time series data of the control signal in the specific time range of an abnormality detection result detected in a sensor signal obtained from the sensor, as verification data, and calculating the reliability of the control signal in the specific time range and; outputting information in which the reliability of the control signal in the specific time range is added to the abnormality detection result in the specific time range, as an abnormality diagnosis result. ### Claim 13 A non-transitory computer readable medium storing an abnormality detection program used for an abnormality detection apparatus that includes a sensor and detects an abnormality of a facility controlled by a control signal, the abnormality detection program for causing a computer to execute: a reliability process to obtain an abnormality degree of a control signal in a specific time range by inputting to a control signal model which is a model that is generated based on training data which is a feature amount of time series data of a past control signal and outputs the abnormality degree for each control signal from the time series data of the control signal, the time series data of the control signal in the specific time range of an abnormality detection result detected in a sensor signal obtained from the sensor, as verification data, and to calculate the reliability of the control signal in the specific time range and; an abnormality diagnosis process to output information in which the reliability of the control signal in the specific time range is added to the abnormality detection result in the specific time range, as an abnormality diagnosis result.