# US 2025/0147347 A1 · Method for inspecting reflecting device > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2025/0147347 A1 - Document ID: US20250147347A1 - Status: Published application - Kind: A1 - Application number: 19/016,275 - Filed: 2025-01-10 - Published: 2025-05-08 - Earliest claimed: 2022-08-01 - Assignees: Japan Display Inc. - Applicants: Japan Display Inc. - Inventors: Daiichi SUZUKI; Shinichiro OKA; Mitsutaka OKITA - Web page: https://patentgrep.com/patent/US20250147347A1 ## CPC - G02F 1/1309: {Repairing; Testing} - G01R 29/0871: {Complete apparatus or systems; circuits, e.g. receivers or amplifiers (G01R29/0878, G01R29/0892 take precedence; dosimeters, warning devices G01R29/0857)} - H01P 1/18: Phase-shifters (H01P1/165 takes precedence) - H01Q 3/36: with variable phase-shifters - H01Q 15/14: Reflecting surfaces; Equivalent structures {(electromagnetic shields H01Q1/526)} - G02F 2203/02: reflective - G02F: OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) - H01P: WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE (operating at optical frequencies G02B) - H01Q: ANTENNAS, i.e. RADIO AERIALS (radiators or antennas for microwave heating H05B6/72) ## Abstract A method for inspecting a reflecting device, which has a plurality of reflecting elements arrayed in a matrix, each of the plurality of reflecting elements comprises a patch electrode, a common electrode on a back side of the patch electrode, and a liquid crystal layer between the patch electrode and the common electrode, a first voltage V1 is applied between one of the plurality of patch electrodes and the common electrode, and whether the reflecting element is good or bad is determined based on changes in a frame region that appears around a periphery of one of the plurality of patch electrodes in a top view when a voltage is applied between one of the plurality of patch electrodes and the common electrode. ## Claims ### Claim 1 A method for inspecting a reflecting device, the reflecting device comprising a plurality of reflecting elements arrayed in a matrix, each of the plurality of reflecting elements comprises a patch electrode, a common electrode on a back side of the patch electrode, and a liquid crystal layer between the patch electrode and the common electrode, the method comprising: applying a first voltage V1 between one of the plurality of patch electrodes and the common electrode, and determining whether the reflecting element is good or bad based on changes in a frame region that appears around a periphery of one of the plurality of patch electrodes in a top view when a voltage is applied between one of the plurality of patch electrodes and the common electrode. ### Claim 2 (depends on 1) The method according to claim 1, wherein the change in the frame region is a change in whether or not a frame region appears around the periphery of the plurality of patch electrodes in the top view when a voltage is applied between the plurality of patch electrodes and the common electrode. ### Claim 3 (depends on 1) The method according to claim 1, wherein whether or not a difference between a width L1 of a frame region when the first voltage V1 is applied and a reference width L1a of the frame region corresponding to the first voltage V1 is within ΔL1 is determined. ### Claim 4 (depends on 3) The method according to claim 3, further comprising, applying a second voltage V2 different from the first voltage V1 between one of the plurality of patch electrodes and the common electrode, respectively, and determining whether or not the width L1 of the frame region when the first voltage V1 is applied is different from a width L2 of the frame region when the second voltage V2 is applied. ### Claim 5 (depends on 4) The method according to claim 4, wherein an absolute value of the second voltage V2 is greater than an absolute value of the first voltage V1, and a reference width L2a of a frame region corresponding to the second voltage V2 is greater than the reference width L1a. ### Claim 6 (depends on 3) The method according to claim 3, further comprising, applying a second voltage V2 different from the first voltage V1 between one of the plurality of patch electrodes and the common electrode, and determining whether or not the difference between a width L2 of the frame region when the second voltage V2 is applied and a reference width L2a of a frame region corresponding to the second voltage V2 is within ΔL2. ### Claim 7 (depends on 4) The method according to claim 4, applying a third voltage V3 between one of the plurality of patch electrodes and the common electrode, and determining whether or not the width L2 is different from a width L3 of the frame region when the third voltage V3 is applied. ### Claim 8 (depends on 7) The method according to claim 7, wherein an absolute value of the third voltage V3 is greater than an absolute value of the second voltage V2, and a reference width L3a of a frame region corresponding to the third voltage V3 is greater than a reference width L2a of a frame region corresponding to the second voltage V2. ### Claim 9 (depends on 6) The method according to claim 6, further comprising, applying a third voltage V3 between one of the plurality of patch electrodes and the common electrode, and determining whether or not the difference between a width L3 of the frame region when the third voltage V3 is applied and a reference width L3a of a frame region corresponding to the third voltage V3 is within ΔL3. ### Claim 10 (depends on 1) The method according to claim 1, wherein the frame region surrounds the patch electrode in the top view, and the frame region is a top surface of a part of the liquid crystal layer. ### Claim 11 (depends on 1) The method according to claim 1, wherein a part of the liquid crystal layer sandwiches the liquid crystal layer between the patch electrode and the common electrode having a surface opposite to the patch electrode in a cross-sectional view. ### Claim 12 (depends on 10) The method according to claim 10, wherein a part of the liquid crystal layer is a part of the liquid crystal layer that is oriented by a diagonal electric field formed between the patch electrode and the common electrode.