Textured stone slabs, systems, and methods
AssigneeCambria Company LLC
InventorsJon Louis Grzeskowiak, II, Martin E. Davis
Life of this patent
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Abstract
Stone slabs, and systems and methods of forming slabs, are described. Some example slabs include a first pattern defined by a first particulate mineral mix and a second pattern defined by a second particulate mineral mix different from the first particulate mineral mix. Locations of the first pattern have a first average thickness perpendicular to the slab width and the slab length, and locations of the second pattern have a second average thickness perpendicular to the slab width and the slab length that is different from the first average thickness.
Claims21
(canceled)
A processed slab comprising:
- a top major surface;
- a bottom major surface;
- a background region comprising a first particulate mix, the background region exposed along the top major surface of the slab and exposed along the bottom major surface of the slab and defining a background surface plane corresponding to the background region exposed along the top major surface;
- and
- a vein region comprising a second particulate mix, the vein region exposed at a recessed depth of the top major surface below the background surface plane, wherein at least a portion of the second particulate mix exists below the recessed depth.
A processed slab having a top major surface and a bottom major surface, the processed slab comprising:
- a first region having a first average thickness between the top major surface and the bottom major surface, the first region exposed along the top major surface and exposed along the bottom major surface;
- and
- a second region having a second average thickness less than the first average thickness, the second region exposed along the top major surface at a second region average recessed depth corresponding to the first average thickness less the second average thickness, wherein at least a portion of the second region exists below the second region average recessed depth.
A processed slab comprising:
- a slab width that is at least 2 feet;
- a slab length that extends perpendicular to the slab width and that is at least 6 feet, the slab length and the slab width defining a contoured top major surface including:
- a first pattern exposed along the top major surface and defined by a first particulate mix, the first pattern defining a first pattern plane,
- second pattern exposed along the top major surface and defined by a second particulate mix, the second pattern recessed from the first pattern plane, wherein at least a portion of the second particulate mix exists where the second pattern is recessed from the first pattern plane.
Dependencies are inferred from the claim text.