Material yield sensor assembly and method of monitoring same
AssigneeSilverleafe Global Ag Tech, LLC
InventorsWilliam Colley, Alex Thomasson, Ruixiu Sui
Life of this patent
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Abstract
A material yield sensor assembly comprising a photodiode and a processing element. The photodiode is configured to generate a signal representative of an amount of material passing by the photodiode. The processing element is configured to convert the signal from an analog form to a digital form, determine a clipping density of the signal, decrease a gain of the signal if the clipping density is greater than a first threshold, and increase the gain of the signal if the clipping density is less than a second threshold to optimize signal integrity versus signal resolution.
Claims19
A material yield sensor assembly comprising:
- a photodiode configured to generate an analog signal representative of an amount of material passing by the photodiode;
- and
- a processing element configured to:
- generate a digital signal corresponding to the analog signal;
- determine a clipping density of the digital signal;
- decrease a gain of the analog signal if the clipping density is greater than a first threshold;
- and
- increase the gain of the analog signal and hence the digital signal if the clipping density is less than a second threshold to optimize signal integrity versus signal resolution of the analog signal and hence the digital signal.
A method of determining a material yield, the method comprising:
- generating an analog signal representative of an amount of material passing by a photodiode of a material yield sensor assembly;
- generating a digital signal corresponding to the analog signal;
- determining a clipping density of the digital signal;
- decreasing a gain of the analog signal and hence the digital signal if the clipping density is greater than a first threshold;
- and
- increasing the gain of the analog signal and hence the digital signal if the clipping density is less than a second threshold to optimize signal integrity versus signal resolution of the analog signal and hence the digital signal.
A material yield sensor assembly comprising:
- a photodiode configured to generate an analog signal representative of an amount of material passing by the photodiode;
- and
- a processing element comprising:
- a transimpedance amplifier module configured to convert the analog signal from a current-based signal to a voltage-based signal;
- a 3-pole band-pass filter module configured to attenuate at least a low frequency and a high frequency from the analog signal;
- a gain module configured to amplify the analog signal;
- an analog-to-digital conversion module configured to generate a digital signal corresponding to the analog signal whereby positive and negative peaks of the digital signal are extracted;
- a synchronous demodulation module configured to difference the positive and negative peaks to convert peak-to-peak amplitudes of the digital signal to DC level in the digital domain;
- and
- a 3-pole low-pass filter module configured to attenuate additional low frequencies from the digital signal,
- the processing element being configured to:
- determine a clipping density of the digital signal;
- decrease a gain of the analog signal and hence the digital signal if the clipping density is greater than a first threshold;
- and
- increase the gain of the analog signal and hence the digital signal if the clipping density is less than a second threshold to optimize signal integrity versus signal resolution of the analog signal and hence the digital signal.
Dependencies are inferred from the claim text.