Semiconductor device
AssigneeJapan Display Inc.
InventorsMarina MOCHIZUKI, Isao SUZUMURA
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Abstract
The purpose of the present invention is to prevent a decrease in light reflection characteristic and an increase in electric resistance due to oxidation of silver in a semiconductor device including an optical sensor in which silver is used for an anode of a photoconductive film. The present invention has a following structure to solve the problem: A semiconductor device includes a thin film transistor formed on a substrate 100. An electrode connected electrically to the thin film transistor is formed of a silver film 128. A first indium tin oxide (ITO) film 129 is formed on the silver film 128. An alumina (AlOx) film 130 is formed on the first ITO film 129.
Claims7
The semiconductor device comprising:
- a thin film transistor formed on a substrate;
- a first ITO film;
- an alumina (AlOx) film;
- and
- a photo sensor,
- wherein the photo sensor includes a photodiode configured with an upper electrode, a photoconductive film, and a lower electrode, above the thin film transistor,
- the photo sensor detects light from side of the upper electrode,
- the upper electrode is formed from a silver film,
- the first ITO film is formed on the silver film, and
- the alumina (AlOx) film is formed on the first ITO film.
The semiconductor device comprising:
- a thin film transistor formed on a substrate;
- a first ITO film;
- and
- a photo sensor,
- wherein the photo sensor includes a photodiode configured with an upper electrode, a photoconductive film, and a lower electrode, above the thin film transistor,
- the photo sensor detects light from side of the upper electrode,
- the upper electrode is formed from a silver film,
- the first ITO film is formed on the silver film, and
- the alumina (AlOx) film is formed on the first ITO film.
Dependencies are inferred from the claim text.