A Film Thickness and Temperature Measuring Device and a Measuring Method Using It
AssigneeLG Chem, Ltd.
InventorsDo Hyun Lee, Seung Heon Lee
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Abstract
The present disclosure relates to a film temperature and thickness measurement apparatus and a measurement method using the same, which can enable manufacturing of a film with a uniform thickness by sequentially measuring the surface temperature and thickness of a film at the same point of the film that is extruded or coating molded in an in-line method, and through control of the temperature and the thickness of the film based on the measured data.
Claims15
An apparatus for measuring a temperature and a thickness of a film being extruded and coating molded, the apparatus comprising:
- a transport unit comprising a plurality of rotating rolls configured to transport the film being molded in one direction;
- a thickness measurement unit installed to be spaced apart from an outer periphery surface of at least one of the plurality of rotating rolls and configured to measure the thickness of the film being transported;
- a temperature measurement unit disposed to be adjacent to the thickness measurement unit and configured to measure a surface temperature of the film being transported;
- and
- a controller configured to determine whether measured values measured through the thickness measurement unit and the temperature measurement unit deviate from reference values, respectively.
A method for measuring a temperature and a thickness of a film, the method comprising the steps of:
- forming a film through an extrusion or coating process;
- transporting the film being molded in one direction through a plurality of rotating rolls;
- measuring a temperature of a film at a predetermined point by irradiating an infrared ray toward a surface of the film being transported by the plurality of rotating rolls;
- measuring a thickness of the film by irradiating the laser at the same or proximity location of the surface of the film of which the temperature has been measured;
- determining whether measured values of the temperature and the thickness of the film deviate from reference values, respectively;
- and
- changing a condition of the film manufacturing process in case that the measured values deviate from the reference values, respectively.
Dependencies are inferred from the claim text.