Methods, systems, articles of manufacture, and apparatus for improved thermal tests of integrated circuit devices
AssigneeIntel Corporation
InventorGregorio R. Murtagian
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AssigneeIntel Corporation
InventorGregorio R. Murtagian
Estimating the term…
Systems, apparatus, articles of manufacture, and methods are disclosed that improve thermal tests of integrated circuit devices. An example apparatus includes interface circuitry; machine readable instructions; and programmable circuitry to at least one of instantiate or execute the machine readable instructions to determine a condition of a fluid to be dispensed by a pneumatic nozzle, the condition of the fluid including a temperature of the fluid; determine a ratio of a first liquid, a second liquid, and a superheated vapor that combine to result in the condition of the fluid; and cause the first liquid, the second liquid, and the superheated vapor to be provided to the pneumatic nozzle in proportions defined by the ratio.
An apparatus comprising:
A non-transitory machine readable storage medium comprising instructions to cause programmable circuitry to at least:
15-21. (canceled)
An apparatus comprising:
28-34. (canceled)
Dependencies are inferred from the claim text.