Method and system for damage localization using low power guided wave
AssigneeTata Consultancy Services Limited
InventorsSUPRIYA GAIN, SUBHADEEP BASU, ARIJIT SINHARAY
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AssigneeTata Consultancy Services Limited
InventorsSUPRIYA GAIN, SUBHADEEP BASU, ARIJIT SINHARAY
Estimating the term…
Use of ultrasonic guided waves for damage identification and localization is not new in Non-Destructive Testing/Evaluation. However, most of the time it is performed with high voltage pulse excitations that use several hundreds of volts in the form of a short burst, thus making it unsafe and unsustainable for defect localization in large structures. Present disclosure provides a method and a system for damage localization using low power ultrasonic guided waves. The system of the present disclosure uses a Vector network analyzer (VNA) sweep of a defined frequency range of low signal amplitude on a structure to form guided wave resonance spectra. Then, the system performs an Inverse Fast Fourier transform (IFFT) on the guided wave resonance spectra to obtain a time domain pulse propagation picture. Thereafter, the system uses a pulse echo based analysis technique based on time domain pulse propagation picture to locate damage position in the structure.
A processor implemented method, comprising:
A damage localization system, comprising:
One or more non-transitory machine-readable information storage mediums comprising one or more instructions which when executed by one or more hardware processors cause:
Dependencies are inferred from the claim text.