Method and system for assessing internal defects of a material
AssigneeWipro Limited
InventorsAkilan BASKAR, Sujatha JAGANNATH
Life of this patent
Estimating the term…
Loading patent…
AssigneeWipro Limited
InventorsAkilan BASKAR, Sujatha JAGANNATH
Estimating the term…
Disclosed herein is a method and system for assessing one or more defects in a material. The method comprises extracting one or more assessment parameters from ultrasound waves propagated through a cross-section of the material. Further, the method identifies presence of one or more defects in the material by analyzing the one or more assessment parameters using a first machine learning model. Further, the method determines a position of each of one or more defects present in the material based on a graphical representation. Thereafter, the method determines a severity score and size of each of the one or more defects using a second machine learning model. Thus, an improved method and system for assessing one or more defects within a material by generating graphical representations of the one or more defects, thereby enhancing accuracy of defect detection is provided.
A method of assessing one or more defects in a material, the method comprising:
A defect assessment system for assessing one or more defects in a material, the defect assessment system comprising:
A non-transitory computer readable medium including instructions stored thereon that when processed by at least one processor, cause a sequence designing system to perform operations comprising:
Dependencies are inferred from the claim text.