Light beam characterization system

A light beam characterization system for characterizing a light beam emitted by a light source, the light beam characterization system comprising:

• a detector comprising at least one detector unit configured to detect light emitted by the light source, and
• a micro-opto-electromechanical system comprising an array of mirrors, each respective mirror being switchable between a first switching state and at least a second switching state, wherein, in the first switching state, the respective mirror reflects the light onto the detector, and in the second switching state, the respective mirror reflects the light away from the detector,
• a controller configured to cause a beam profile measurement to be performed on the light detected by the at least one detector unit while selectively switching the mirrors in the array of mirrors between the first switching state and the second switching state, and
• an optical unit configured to direct the light in a form of at least two different input light beams onto the micro-opto-electromechanical system,
• wherein the controller is configured to cause the beam profile measurement to be performed on each of the at least two input light beams.