Semiconductor device
AssigneeKabushiki Kaisha Toshiba
InventorsTomoaki INOKUCHI, Hiro GANGI, Yusuke KOBAYASHI, Tatsunori SAKANO, Tatsuo SHIMIZU, Shotaro BABA, Taichi FUKUDA
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AssigneeKabushiki Kaisha Toshiba
InventorsTomoaki INOKUCHI, Hiro GANGI, Yusuke KOBAYASHI, Tatsunori SAKANO, Tatsuo SHIMIZU, Shotaro BABA, Taichi FUKUDA
Estimating the term…
The major element includes a first electrode, a second electrode, a first semiconductor layer located between the first electrode and the second electrode, the first semiconductor layer forming a first Schottky junction with the second electrode, and a first gate electrode facing the first Schottky junction. The control element includes a third electrode, a fourth electrode, a second semiconductor layer located between the third electrode and the fourth electrode, the second semiconductor layer forming a second Schottky junction with the fourth electrode, and a second gate electrode facing the second Schottky junction.
A semiconductor device, comprising:
Dependencies are inferred from the claim text.