# US 2025/0098148 A1 · Method of manufacturing memory structure

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- Number: US 2025/0098148 A1
- Document ID: US20250098148A1
- Status: Published application
- Kind: A1
- Application number: 18/970,848
- Filed: 2024-12-05
- Published: 2025-03-20
- Earliest claimed: 2022-05-25
- Assignees: Nanya Technology Corporation
- Applicants: Nanya Technology Corporation
- Inventors: Wei-Chih WANG
- Web page: https://patentgrep.com/patent/US20250098148A1

## CPC

- H10B 12/34: {the transistor being at least partially in a trench in the substrate}
- H10B 12/485: {Bit line contacts}
- H10B 12/0335: {Making a connection between the transistor and the capacitor, e.g. plug}
- H10B 12/053: {the transistor being at least partially in a trench in the substrate (vertical transistor in combination with a capacitor formed in a substrate trench H10B12/0383)}
- H10B 12/315: {with the capacitor higher than a bit line}
- H10B: ELECTRONIC MEMORY DEVICES

## Abstract

A method of manufacturing a memory structure provided by the present disclosure includes forming a first dielectric layer on a source/drain region, forming a second dielectric layer on the first dielectric layer, and forming a mask layer including a mask opening exposing the second dielectric layer, where a distance between a sidewall of the mask opening and a sidewall of the source/drain region is 30% to 60% of a width of the source/drain region. The method further includes etching the second dielectric layer and the first dielectric layer through the mask opening to form a first opening exposing a top surface and another sidewall of the source/drain region, etching the source/drain region through the first opening to form a second opening, and filling the second opening with a conductive material to form a contact.

## Claims

### Claim 1

A method of manufacturing a memory structure, comprising:
forming a first dielectric layer on a source/drain region and a second dielectric layer on the first dielectric layer;
forming a mask layer on the second dielectric layer, wherein the mask layer comprises a mask opening exposing the second dielectric layer, and a distance between a sidewall of the mask opening and a sidewall of the source/drain region is 30% to 60% of a width of the source/drain region;
etching the second dielectric layer and the first dielectric layer through the mask opening to form a first opening, wherein the first opening exposes a top surface and another sidewall of the source/drain region;
etching the source/drain region through the first opening to form a second opening; and
filling the second opening with a conductive material to form a contact.

### Claim 2 (depends on 1)

The method of claim 1, wherein a bottom surface of the second opening comprises a first portion exposing the source/drain region, a second portion exposing the first dielectric layer, and a third portion exposing the second dielectric layer, the second portion is lower than the first portion, and the first portion is lower than the third portion.

### Claim 3 (depends on 2)

The method of claim 2, wherein the second portion further exposes the source/drain region.

### Claim 4 (depends on 1)

The method of claim 1, wherein a bottom surface of the second opening comprises a first portion exposing the source/drain region, a second portion exposing the first dielectric layer, and a third portion exposing the second dielectric layer, the second portion is coplanar with the first portion, and the second portion is lower than the third portion.

### Claim 5

A method of manufacturing a memory structure, comprising:
forming a first dielectric layer on a source/drain region and a second dielectric layer on the first dielectric layer;
forming a first opening in the second dielectric layer and the first dielectric layer by a first etching operation, wherein the first etching operation stops at a top surface of the source/drain region;
extending the first opening into the source/drain region by a second etching operation to form a second opening, wherein the second opening comprises a first portion extending into the source/drain region, a second portion extending into the first dielectric layer, and a third portion extending into the second dielectric layer; and
filling the second opening with a conductive material to form a contact for the source/drain region.

### Claim 6 (depends on 5)

The method of claim 5, wherein a distance between a sidewall of the first portion of the second opening and a sidewall of the source/drain region is 30% to 60% of a width of the source/drain region.

### Claim 7 (depends on 5)

The method of claim 5, wherein a width of the second portion of the second opening is equal to or larger than a width of the first dielectric layer.

### Claim 8 (depends on 5)

The method of claim 5, wherein a bottom surface of the third portion of the second opening is coplanar with the top surface of the source/drain region.

### Claim 9 (depends on 5)

The method of claim 5, wherein the top surface and one of sidewalls of the source/drain region are exposed by the first opening after the first etching operation.

### Claim 10 (depends on 5)

The method of claim 5, wherein the first dielectric layer is etched in a faster rate than the second dielectric layer during the first etching operation.

### Claim 11 (depends on 5)

The method of claim 5, wherein the first opening formed by the first etching operation comprises:
a first bottom surface coplanar with the top surface of the source/drain region;
a second bottom surface lower than the first bottom surface; and
a third bottom surface coplanar with the first bottom surface, wherein the second bottom surface physically connects the first bottom surface and the third bottom surface.

### Claim 12 (depends on 11)

The method of claim 11, wherein a distance between the top surface of the source/drain region and the second bottom surface of the first opening is in a range of 10 nm to 20 nm.

### Claim 13 (depends on 11)

The method of claim 11, wherein a width of the second bottom surface of the first opening is equal to a width of the first dielectric layer.

### Claim 14 (depends on 5)

The method of claim 5, wherein the second etching operation etches downward from the top surface of the source/drain region and etches laterally from one of sidewalls of the source/drain region to form the second opening.

### Claim 15

A method of manufacturing a memory structure, comprising:
forming a first dielectric layer covering a first source/drain region and a second source/drain region;
forming a second dielectric layer on the first dielectric layer;
forming a first opening extending into the first source/drain region by a first etching operation and a second etching operation, wherein the first etching operation is selective to the first dielectric layer and the second dielectric layer, the second etching operation is selective to the first source/drain region, and sidewalls of the first opening are offset from sidewalls of the first source/drain region;
forming a second opening extending into the second source/drain region by a third etching operation and a fourth etching operation, wherein the third etching operation is selective to the first dielectric layer and the second dielectric layer, and the fourth etching operation is selective to the second source/drain region; and
filling the first opening and the second opening with a conductive material to form a first contact and a second contact, respectively.

### Claim 16 (depends on 15)

The method of claim 15, wherein one of the sidewalls of the first opening is offset from one of the sidewalls of the first source/drain region by a distance that is 30% to 60% of a width of the first source/drain region.

### Claim 17 (depends on 15)

The method of claim 15, wherein one of the sidewalls of the first opening and a first sidewall of the first dielectric layer on the first source/drain region is separated by 30% to 60% of a distance between the first sidewall of the first dielectric layer and a second sidewall of the first dielectric layer on the second source/drain region.

### Claim 18 (depends on 15)

The method of claim 15, wherein a bottom surface of the first opening extending into the first dielectric layer on the first source/drain region is coplanar with a bottom surface of the second opening extending into the first dielectric layer on the second source/drain region.

### Claim 19 (depends on 15)

The method of claim 15, wherein an etching amount of the second source/drain region etched by the fourth etching operation is less than an etching amount of the first source/drain region etched by the second etching operation.

### Claim 20 (depends on 15)

The method of claim 15, further comprising:
forming the first source/drain region on a digit region of a substrate; and
forming the second source/drain region on a cell region of the substrate.