Film forming method and film forming apparatus
AssigneeTokyo Electron Limited
InventorsTomohiro NAKAGAWA, Yumiko KAWANO, Shuji AZUMO
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AssigneeTokyo Electron Limited
InventorsTomohiro NAKAGAWA, Yumiko KAWANO, Shuji AZUMO
Estimating the term…
Film forming method of present disclosure's embodiment is method for forming silicon oxide film on substrate, and includes: (a) preparing substrate having on surface thereof first region where insulating film is exposed and second region where conductive film is exposed; (b) selectively forming inhibiting layer inhibiting silicon oxide film formation on second region; (c) forming silicon oxide film on first region while inhibiting silicon oxide film formation on second region by inhibiting layer; and (d) reforming silicon oxide film formed on first region. (c) includes (c1) supplying metal catalyst gas to surface and adsorbing it to first region; and (c2) supplying silanol-containing gas to surface to react it with metal catalyst gas adsorbed to first region to form silicon oxide film. (d) includes: (d1) exposing surface to plasma formed from hydrogen gas-containing first gas; and (d2) exposing surface to plasma formed from second gas containing inert gas without hydrogen gas.
A film forming method for forming a silicon oxide film on a substrate, the film forming method comprising:
A film forming apparatus for forming a silicon oxide film on a substrate, the film forming apparatus comprising:
Dependencies are inferred from the claim text.