Systems, Methods, and Media for Manufacturing Processes
AssigneeNanotronics Imaging, Inc.
InventorsAndrew Sundstrom, Damas Limoge, Eun-Sol Kim, Vadim Pinskiy, Matthew C. Putman
Life of this patent
Estimating the term…
Abstract
A manufacturing system is disclosed herein. The manufacturing system includes one or more stations, a monitoring platform, and a control module. Each station of the one or more stations is configured to perform at least one step in a multi-step manufacturing process for a component. The monitoring platform is configured to monitor progression of the component throughout the multi-step manufacturing process. The control module is configured to dynamically adjust processing parameters of each step of the multi-step manufacturing process to achieve a desired final quality metric for the component.
Claims21
1-20. (canceled)
A manufacturing system for an automatic production line in a factory, comprising:
- one or more stations, each station configured to perform at least one step in a multi-step manufacturing process for a component;
- a monitoring platform configured to monitor progression of the component throughout the multi-step manufacturing process;
- and
- a control module configured to dynamically adjust processing parameters of a step of the multi-step manufacturing process to achieve a desired final quality metric for the component, the control module configured to perform operations, comprising:
- receiving image data of tooling of a first station of the one or more stations;
- extracting, from the image data, a subset of images, wherein each image of the subset of images includes the tooling of the first station, and the subset of images represent an entire manufacturing process for the component in the first station;
- determining, by a machine learning model, a final quality metric for the component, based on the subset of images;
- determining that the final quality metric is not within a threshold tolerance from the final quality metric;
- and
- based on the determining, updating the processing parameters of subsequent stations in the multi-step manufacturing process.
A method, comprising:
- receiving, from a monitoring platform of a manufacturing system, image data of tooling of a first station of one or more stations of the manufacturing system;
- extracting, from the image data, a subset of images, wherein each image of the subset of images includes the tooling of the first station, and the subset of images represent an entire manufacturing process for a component in the first station;
- determining, by a machine learning model, a final quality metric for the component, based on the subset of images;
- determining that the final quality metric is not within a threshold tolerance from the final quality metric;
- and
- based on the determining, updating processing parameters of subsequent stations in a multi-step manufacturing process.
A manufacturing system, comprising:
- a plurality of stations, each station configured to perform at least one step in a multi-step manufacturing process for a component;
- and
- a control module configured to dynamically adjust processing parameters of a step of the multi-step manufacturing process to achieve a desired final quality metric for the component, the control module configured to perform operations, comprising:
- identifying positional information of tooling at a first station of the plurality of stations, the tooling configured to process the component at the first station;
- determining, based on the positional information, that an error in the multi-step manufacturing process is present;
- based on determining that the error is present, generating an updated instruction set to correct the error, the updated instruction set to be performed by a downstream station;
- validating that the updated instruction set corrects the error by predicting, using a machine learning model, a final quality metric for the component based on the updated instruction set, wherein the final quality metric is a metric associated with the component that cannot be measured until processing of the component in the multi-step manufacturing process is complete;
- and
- based on the predicted final quality metric, providing the updated instruction set to the downstream station.
Dependencies are inferred from the claim text.