# US 2025/0093510 A1 · Position measuring system > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2025/0093510 A1 - Document ID: US20250093510A1 - Status: Published application - Kind: A1 - Application number: 18/830,736 - Filed: 2024-09-11 - Published: 2025-03-20 - Earliest claimed: 2023-09-15 - Assignees: Dr. Johannes Heidenhain GmbH - Applicants: DR. JOHANNES HEIDENHAIN GmbH - Inventors: Wolfgang HOLZAPFEL; Michael STEPPUTAT - Web page: https://patentgrep.com/patent/US20250093510A1 ## CPC - G01D 5/38: by diffraction gratings - G01S 7/4814: {of transmitters alone} - G01S 7/4817: {relating to scanning} - G01S 17/48: Active triangulation systems, i.e. using the transmission and reflection of electromagnetic waves other than radio waves - G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR - G01S: RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES ## Abstract A position measuring system for determining spatial position information includes at least one light source and at least one optical receiving unit. The receiving unit has a scanning grating and an optoelectronic detector arrangement whose light-sensitive surfaces are oriented in the direction of the scanning grating. The detector arrangement has two detector regions arranged in a detection plane mirror-symmetrically to a first axis of symmetry that extends through the center of the detector arrangement in the detection plane, in which the first axis of symmetry is oriented orthogonally to the longitudinal extension direction of the detector regions. The two detector regions have the shape of an isosceles, acute-angled triangle whose triangle tips are oriented with the tip angle in the direction of the center of the detector arrangement. ## Claims ### Claim 1 A position measuring system for determining spatial position information, comprising: at least one light source; and at least one optical receiver unit including a scanning grating and an optoelectronic detector arrangement having light-sensitive surfaces oriented in a direction of the scanning grating; wherein the detector arrangement includes two first detector regions arranged in a detection plane mirror-symmetrically to a first axis of symmetry that extends through a center of the detector arrangement in the detection plane, the first axis of symmetry being oriented orthogonally to a longitudinal extension direction of the first detector regions; and wherein each of the first detector regions is shaped as an isosceles, acute-angled triangle having an apex, with an apex angle, oriented in a direction of the center of the detector arrangement. ### Claim 2 (depends on 1) The position measuring system according to claim 1, wherein the detector arrangement includes two further detector regions arranged identically to the two first detector regions and arranged mirror-symmetrically to a second axis of symmetry that extends in the detection plane through the center of the detector arrangement and that is oriented orthogonally to the first axis of symmetry. ### Claim 3 (depends on 1) The position measuring system according to claim 1, wherein the following relationship is satisfied: γ / 2 = 7 . 1 ⁢ 2 ⁢ 5 ∘ + / - 5 ∘ , γ representing the apex angle, the apexes, with the apex angle, touching one another in the center of the detector arrangement. ### Claim 4 (depends on 1) The position measuring system according to claim 1, wherein each detector region includes a plurality of individual detector elements arranged periodically and parallel to one another along an arrangement direction oriented perpendicular to the longitudinal extension direction of the detector regions. ### Claim 5 (depends on 4) The position measuring system according to claim 4, wherein each detector element is rectangular in shape and has a rectangle longitudinal axis oriented parallel to the longitudinal extension direction of the detector region, and every fourth detector element is electrically interconnected along the arrangement direction, so that four phase-shifted output signals for further processing result from scanning of a stripe pattern falling on the detector arrangement. ### Claim 6 (depends on 5) The position measuring system according to claim 5, wherein a ratio of detector element width and detector element periodicity is 1:7. ### Claim 7 (depends on 5) The position measuring system according to claim 5, wherein, for a change in detector element length along the arrangement direction, the following relationship is satisfied: dh_D / dx = + / - 8 , h_D representing the detector element length, x representing the arrangement direction. ### Claim 8 (depends on 1) The position measuring system according to claim 1, wherein the scanning grating is arranged in a plane parallel to the detection plane and includes a periodic arrangement of grating regions along at least one grating direction that is arranged at an angle of 45° to the longitudinal extension direction of the detector regions. ### Claim 9 (depends on 8) The position measuring system according to claim 8, wherein the scanning grating is arranged as a transmissive, combined amplitude-phase grating, an identically formed, opaque amplitude grating structure being arranged in each grating region, a phase shift layer being arranged along each grating direction in every second grating region above the amplitude grating structure. ### Claim 10 (depends on 9) The position measuring system according to claim 9, wherein a material and a layer thickness of the phase shift layer results in suppression of 0th diffraction order and all even diffraction orders for a predetermined wavelength range and for a predetermined angle of incidence range. ### Claim 11 (depends on 9) The position measuring system according to claim 9, wherein the amplitude grating structure is configured for preferential transmission into +/−1st diffraction orders and suppression of odd diffraction orders for a predetermined wavelength range. ### Claim 12 (depends on 1) The position measuring system according to claim 1, wherein the scanning grating is arranged on a side of a transparent cover plate of the receiver unit that is oriented in a direction of the detector arrangement. ### Claim 13 (depends on 9) The position measuring system according to claim 9, wherein the combined amplitude-phase grating has a checkerboard configuration with a periodic arrangement of square grating regions along two orthogonal grating directions. ### Claim 14 (depends on 13) The position measuring system according to claim 13, wherein the amplitude grating structure includes opaque grating bars arranged parallel to one another along the two grating directions and having at least partially different grating bar widths, the amplitude grating structures in grating regions that are arranged adjacent along a respective grating direction are arranged mirror-symmetrically to an axis of symmetry that extends along a boundary of the adjacent grating regions. ### Claim 15 (depends on 1) The position measuring system according to claim 1, wherein the light source includes an LED adapted to emit radiation in a wavelength range λ=850 nm+/−20 nm and having a coherence length of less than or equal to 7 μm. ### Claim 16 (depends on 2) The position measuring system according to claim 2, wherein the following relationship is satisfied: γ / 2 = 7 . 1 ⁢ 2 ⁢ 5 ∘ + / - 5 ∘ , γ representing the apex angle, the apexes, with the apex angle, touching one another in the center of the detector arrangement. ### Claim 17 (depends on 1) The position measuring system according to claim 1, wherein the light source and the optical receiver unit are movable relative to each other. ### Claim 18 (depends on 10) The position measuring system according to claim 10, wherein the material of the phase shift layer includes titanium pentoxide.