Apparatus for testing a device under test separating errors within a received pattern associated with different functional blocks of a device under test or associated with different blocks of one or more bits, method and computer program

Abstract

A test apparatus for testing a device under test, is configured to receive a pattern from the device under test, which comprises information from a plurality of functional blocks of the device under test. The test apparatus is configured to separate errors within the received pattern associated with different functional blocks of the device under test during an execution of a test program, or the test apparatus is configured to separate errors within the received pattern associated with different blocks of one or more bits during an execution of a test program. A method and a computer program are also described.

Dependencies are inferred from the claim text.