Specification analyzer
AssigneeSysmex Corporation
InventorsJunya Ikuta, Noriyuki NAKANISHI, Kota MISAWA, Toru MIZUHASHI
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AssigneeSysmex Corporation
InventorsJunya Ikuta, Noriyuki NAKANISHI, Kota MISAWA, Toru MIZUHASHI
Estimating the term…
Disclosed is an analyzer configured to analyze a specimen, including: first and second sample preparation parts configured to prepare a first measurement sample from the specimen by using a first reagent; a third sample preparation part configured to prepare a second measurement sample from the specimen by using a second reagent; an optical measurement part configured to measure the first measurement sample to obtain an optical signal corresponding to white blood cells; an electric measurement part configured to measure the second measurement sample to obtain an electric signal corresponding to red blood cells; an analysis part configured to analyze the specimen, based on the optical signal and the electric signal; and a controller. The controller, according to a plurality of measurement orders, controls sample preparation in the first and second sample preparation parts and sample measurement by the optical measurement part such that at least a part of a period including preparation of the first measurement sample by the first sample preparation part, and measurement, by the optical measurement part, of the first measurement sample prepared in the first sample preparation part, overlaps with at least a part of a period including preparation of the first measurement sample by the second sample preparation part, and measurement, by the optical measurement part, of the first measurement sample prepared in the second sample preparation part.
An analyzer configured to analyze a specimen, comprising:
Dependencies are inferred from the claim text.