# US 2025/0093283 A1 · X-ray inspection device and calibration method thereof

> Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt

- Number: US 2025/0093283 A1
- Document ID: US20250093283A1
- Status: Published application
- Kind: A1
- Application number: 18/883,429
- Filed: 2024-09-12
- Published: 2025-03-20
- Earliest claimed: 2023-09-20
- Assignees: Anritsu Corporation
- Applicants: Anritsu Corporation
- Inventors: Akira OHASHI
- Web page: https://patentgrep.com/patent/US20250093283A1

## CPC

- G01N 23/083: the radiation being X-rays
- G01N 23/04: and forming images of the material
- G01N 2223/204: source created from radiated target
- G01N 2223/303: calibrating, standardising
- G01N 2223/401: image processing
- G01N 2223/50: Detectors
- G01N 2223/643: object on conveyor
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)

## Abstract

An X-ray inspection device includes an X-ray detection element that outputs a pulse signal with a peak value corresponding to an energy of an X-ray passing through an inspection region, an X-ray detection unit consisting of a plurality of pixels that detect the number of the pulse signals exceeding a predetermined threshold voltage, among the pulse signals output from the X-ray detection element, a storage unit that stores, for each pixel, a correspondence relationship between a value of a control parameter to cause the number of the pulse signals exceeding the threshold voltage to change and the number of the pulse signals detected by respective pixels, and an output unit that outputs abnormal pixel information based on the correspondence relationship between the value of the control parameter and the number of the pulse signals detected by respective pixels, the correspondence relationship being read out from the storage unit.

## Claims

### Claim 1

An X-ray inspection device comprising:
an X-ray generation source that irradiates an inspection region with an X-ray;
an X-ray detector that detects the X-ray passing through the inspection region, the X-ray detector including an X-ray detection element that outputs a pulse signal with a peak value corresponding to an energy of the X-ray passing through the inspection region and an X-ray detection unit consisting of a plurality of pixels that detect the number of the pulse signals exceeding a predetermined threshold voltage, among the pulse signals output from the X-ray detection element;
a storage unit that stores, for each pixel, a correspondence relationship between a value of a control parameter to cause the number of the pulse signals exceeding the threshold voltage to change and the number of the pulse signals detected by respective pixels; and
an abnormal pixel information output unit that outputs abnormal pixel information to specify an abnormal pixel based on the correspondence relationship between the value of the control parameter and the number of the pulse signals detected by respective pixels, the correspondence relationship being read out from the storage unit.

### Claim 2

An X-ray inspection device comprising:
an X-ray generation source that irradiates an inspection region with an X-ray;
an X-ray detector that detects the X-ray passing through the inspection region;
a display unit that displays various types of information; and
an input/output unit that is connectable to an external device,
wherein the X-ray detector includes
an X-ray detection element that outputs a pulse signal with a peak value corresponding to an energy of the X-ray passing through the inspection region,
an X-ray detection unit consisting of a plurality of pixels that detect the number of the pulse signals exceeding a predetermined threshold voltage, among the pulse signals output from the X-ray detection element, and
a control parameter control unit that performs control of changing a value of a control parameter to cause the number of the pulse signals exceeding the threshold voltage to change, and
the external device includes
a storage unit that stores, for each pixel, a correspondence relationship between the value of the control parameter controlled by the control parameter control unit and the number of the pulse signals detected by respective pixels, which is input via the input/output unit, and
an abnormal pixel information output unit that generates abnormal pixel information to specify an abnormal pixel, based on the correspondence relationship between the value of the control parameter and the number of the pulse signals detected by respective pixels, the correspondence relationship being read out from the storage unit, and outputs the abnormal pixel information to the display unit via the input/output unit.

### Claim 3 (depends on 1)

The X-ray inspection device according to claim 1,
wherein the control parameter is the threshold voltage or a tube voltage of the X-ray generation source.

### Claim 4 (depends on 2)

The X-ray inspection device according to claim 2,
wherein the control parameter is the threshold voltage or a tube voltage of the X-ray generation source.

### Claim 5 (depends on 1)

The X-ray inspection device according to claim 1,
wherein the control parameter is any one of the threshold voltage, a tube voltage of the X-ray generation source, or a type of a radiation quality variable body set up in the inspection region.

### Claim 6 (depends on 2)

The X-ray inspection device according to claim 2,
wherein the control parameter is any one of the threshold voltage, a tube voltage of the X-ray generation source, or a type of a radiation quality variable body set up in the inspection region.

### Claim 7 (depends on 5)

The X-ray inspection device according to claim 5,
wherein the control parameter is the threshold voltage, and
the radiation quality variable body has a known absorption edge,
the X-ray inspection device further comprising:
a control parameter value specifying unit that specifies, for each pixel, the threshold voltage at which an inclination of the number of the pulse signals detected by respective pixels, which is read out from the storage unit, with respect to the control parameter changes discontinuously; and
a calibration information output unit that outputs the threshold voltage specified by the control parameter value specifying unit in association with the known absorption edge, as calibration information for respective pixels.

### Claim 8 (depends on 6)

The X-ray inspection device according to claim 6,
wherein the control parameter is the threshold voltage, and
the radiation quality variable body has a known absorption edge,
the X-ray inspection device further comprising:
a control parameter value specifying unit that specifies, for each pixel, the threshold voltage at which an inclination of the number of the pulse signals detected by respective pixels, which is read out from the storage unit, with respect to the control parameter changes discontinuously; and
a calibration information output unit that outputs the threshold voltage specified by the control parameter value specifying unit in association with the known absorption edge, as calibration information for respective pixels.

### Claim 9 (depends on 3)

The X-ray inspection device according to claim 3,
wherein the control parameter is the threshold voltage,
the X-ray inspection device further comprising:
a control parameter value specifying unit that specifies, for each pixel, a minimum threshold voltage at which the number of pulse signals detected by respective pixels, which is read out from the storage unit, is smaller than a predetermined value; and
a calibration information output unit that outputs the threshold voltage specified by the control parameter value specifying unit in association with the tube voltage, as calibration information for respective pixels.

### Claim 10 (depends on 4)

The X-ray inspection device according to claim 4,
wherein the control parameter is the threshold voltage,
the X-ray inspection device further comprising:
a control parameter value specifying unit that specifies, for each pixel, a minimum threshold voltage at which the number of pulse signals detected by respective pixels, which is read out from the storage unit, is smaller than a predetermined value; and
a calibration information output unit that outputs the threshold voltage specified by the control parameter value specifying unit in association with the tube voltage, as calibration information for respective pixels.

### Claim 11 (depends on 3)

The X-ray inspection device according to claim 3,
wherein the control parameter is the tube voltage,
the X-ray inspection device further comprising:
a control parameter value specifying unit that specifies, for each pixel, a maximum tube voltage at which the number of pulse signals detected by respective pixels, which is read out from the storage unit, is smaller than a predetermined value; and
a calibration information output unit that outputs the tube voltage specified by the control parameter value specifying unit in association with the threshold voltage, as calibration information for respective pixels.

### Claim 12 (depends on 4)

The X-ray inspection device according to claim 4,
wherein the control parameter is the tube voltage,
the X-ray inspection device further comprising:
a control parameter value specifying unit that specifies, for each pixel, a maximum tube voltage at which the number of pulse signals detected by respective pixels, which is read out from the storage unit, is smaller than a predetermined value; and
a calibration information output unit that outputs the tube voltage specified by the control parameter value specifying unit in association with the threshold voltage, as calibration information for respective pixels.

### Claim 13 (depends on 5)

The X-ray inspection device according to claim 5,
wherein the control parameter is the tube voltage,
the X-ray inspection device further comprising:
a control parameter value specifying unit that specifies, for each pixel, a maximum tube voltage at which the number of pulse signals detected by respective pixels, which is read out from the storage unit, is smaller than a predetermined value; and
a calibration information output unit that outputs the tube voltage specified by the control parameter value specifying unit in association with the threshold voltage, as calibration information for respective pixels.

### Claim 14 (depends on 6)

The X-ray inspection device according to claim 6,
wherein the control parameter is the tube voltage,
the X-ray inspection device further comprising:
a control parameter value specifying unit that specifies, for each pixel, a maximum tube voltage at which the number of pulse signals detected by respective pixels, which is read out from the storage unit, is smaller than a predetermined value; and
a calibration information output unit that outputs the tube voltage specified by the control parameter value specifying unit in association with the threshold voltage, as calibration information for respective pixels.

### Claim 15

A calibration method of an X-ray inspection device including an X-ray generation source that irradiates an inspection region with an X-ray, and
an X-ray detector that detects the X-ray passing through the inspection region, the X-ray detector including an X-ray detection element that outputs a pulse signal with a peak value corresponding to an energy of the X-ray passing through the inspection region and an X-ray detection unit consisting of a plurality of pixels that detect the number of the pulse signals exceeding a predetermined threshold voltage, among the pulse signals output from the X-ray detection element, the calibration method comprising:
a step of irradiating the inspection region with the X-ray;
an X-ray detection step of detecting the X-ray passing through the inspection region;
a storage step of storing, for each pixel, a correspondence relationship between a value of a control parameter to cause the number of the pulse signals exceeding the threshold voltage to change and the number of the pulse signals detected by respective pixels, in a storage unit; and
an abnormal pixel information output step of outputting abnormal pixel information to specify an abnormal pixel based on the correspondence relationship between the value of the control parameter and the number of the pulse signals detected by respective pixels, the correspondence relationship being read out from the storage unit.

### Claim 16

A calibration method of an X-ray inspection device including an X-ray generation source that irradiates an inspection region with an X-ray, and
an X-ray detector that detects the X-ray passing through the inspection region, in which the X-ray detector includes
an X-ray detection element that outputs a pulse signal with a peak value corresponding to an energy of the X-ray passing through the inspection region, and
an X-ray detection unit consisting of a plurality of pixels that detect the number of the pulse signals exceeding a predetermined threshold voltage, among the pulse signals output from the X-ray detection element, the calibration method comprising:
a step of setting up a radiation quality variable body having a known absorption edge in the inspection region;
a step of irradiating the inspection region with the X-ray;
an X-ray detection step of detecting the X-ray passing through the inspection region;
a storage step of storing, for each pixel, a correspondence relationship between a value of a control parameter to cause the number of the pulse signals exceeding the threshold voltage to change and the number of the pulse signals detected by respective pixels, in a storage unit;
a control parameter value specifying step of specifying, for each pixel, the threshold voltage at which an inclination of the number of the pulse signals detected by respective pixels, which is read out from the storage unit, with respect to the control parameter changes discontinuously; and
a calibration information output step of outputting the threshold voltage specified in the control parameter value specifying step in association with the known absorption edge, as calibration information for respective pixels.

### Claim 17 (depends on 15)

The calibration method according to claim 15,
wherein the control parameter is any of the threshold voltage, a tube voltage of the X-ray generation source, or a type of a radiation quality variable body set up in the inspection region.

### Claim 18 (depends on 16)

The calibration method according to claim 16,
wherein the control parameter is any of the threshold voltage, a tube voltage of the X-ray generation source, or a type of a radiation quality variable body set up in the inspection region.

### Claim 19 (depends on 17)

The calibration method according to claim 17,
wherein the control parameter is the threshold voltage, and
the radiation quality variable body has a known absorption edge,
the calibration method further comprising:
a control parameter value specifying step of specifying, for each pixel, the threshold voltage at which an inclination of the number of the pulse signals detected by respective pixels, which is read out from the storage unit, with respect to the control parameter changes discontinuously; and
a calibration information output step of outputting the threshold voltage specified in the control parameter value specifying step in association with the known absorption edge, as calibration information for respective pixels.

### Claim 20 (depends on 18)

The calibration method according to claim 18,
wherein the control parameter is the threshold voltage, and
the radiation quality variable body has a known absorption edge,
the calibration method further comprising:
a control parameter value specifying step of specifying, for each pixel, the threshold voltage at which an inclination of the number of the pulse signals detected by respective pixels, which is read out from the storage unit, with respect to the control parameter changes discontinuously; and
a calibration information output step of outputting the threshold voltage specified in the control parameter value specifying step in association with the known absorption edge, as calibration information for respective pixels.