# US 2025/0093262 A1 · Imaging device for correcting and reconstructing target image in scattering medium using multiple scattering tracing algorithm based on reflection matrix and method thereof > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2025/0093262 A1 - Document ID: US20250093262A1 - Status: Published application - Kind: A1 - Application number: 18/828,107 - Filed: 2024-09-09 - Published: 2025-03-20 - Earliest claimed: 2023-09-18 - Assignees: Korea University Research and Business Foundation; Institute for Basic Science - Applicants: Korea University Research and Business Foundation; Institute for Basic Science - Inventors: Won Shik CHOI; Sung Sam KANG; Seok Chan YOON - Web page: https://patentgrep.com/patent/US20250093262A1 ## CPC - G01N 21/4738: {Diffuse reflection (precedence is given to G01N21/55 - G01N21/57 if specular component is taken into consideration), e.g. also for testing fluids, fibrous materials} - G01N 21/4795: {spatially resolved investigating of object in scattering medium (in vivo A61B)} - G01N 33/025: {Fruits or vegetables} - G01N 33/4833: {of solid biological material, e.g. tissue samples, cell cultures (tissue in vivo A61B5/00; cell suspensions G01N33/48735)} - G06T 5/80: Geometric correction - G01N 2021/4797: {time resolved, e.g. analysis of ballistic photons} - G06T 2207/10056: Microscopic image - G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q) - G06T: IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ## Abstract Disclosed are an imaging device for correcting and reconstructing a target image in a scattering medium using a multiple scattering tracing algorithm based on a reflection matrix and a method thereof. According to an embodiment of the present disclosure, the imaging device corrects and reconstructs an image of a target object located deep inside a scattering medium such as a biological tissue by tracing a multiple scattering trajectory using a time-resolved reflection matrix obtained from an imaging device that uses a time-resolved light source and then correcting it. ## Claims ### Claim 1 An imaging device, comprising: a light source configured to make light incident on a target object by passing through a scattering medium and multiple scattering components within the scattering medium; a detector configured to detect light returned after the incident light transmits and reflects the multiple scattering components of the target object; a reflection matrix measurer configured to measure a time-resolved reflection matrix reflecting multiple scattering trajectories based on the multiple scattering components based on the returning light; an algorithm processor configured to obtain an incident transmission matrix and a reflection transmission matrix by numerically iteratively accessing a plurality of phase planes approximated from the scattering medium according to a multiple scattering tracing algorithm and to obtain an object reflection matrix by reflecting inverse matrices of the obtained incident transmission matrix and the obtained reflection transmission matrix into the measured time-resolved reflection matrix; and an image processor configured to acquire an image in which multiple scattering distortion is corrected according to the multiple scattering trajectory based on the obtained object reflection matrix. ### Claim 2 (depends on 1) The imaging device according to claim 1, wherein the algorithm processor performs numerical iterative access to each phase plane by multiplying an input or output end of the time-resolved reflection matrix by a spatial propagation matrix (Pk) corresponding to a distance to a k-th phase plane based on the multiple scattering tracing algorithm to obtain a plurality of incident transmission matrices and reflection transmission matrices corresponding to the k-th. ### Claim 3 (depends on 1) The imaging device according to claim 1, wherein, in consideration of a case where light is focused on two different points for a specific phase plane among the plural phase planes, the algorithm processor obtains a difference between phase delay values of the two points based on the multiple scattering tracing algorithm, and applies the obtained difference to an incident transmission matrix and reflection transmission matrix obtained for the specific phase plane. ### Claim 4 (depends on 1) The imaging device according to claim 1, wherein each of the plural phase planes calculates a transmission matrix in relation to the multiple scattering components inside the scattering medium, designs a first phase plane based on the calculated transmission matrix, and designs a second phase plane on the designed first phase plane based on the inverse transmission matrix of the calculated transmission matrix to be virtually located inside the scattering medium or to be located on the scattering medium. ### Claim 5 (depends on 1) The imaging device according to claim 1, wherein a location of the plural phase planes is determined by measuring an electric field intensity through application of the multiple scattering tracing algorithm while changing a distance from the target object, and is determined as a location where the measured electric field intensity is greater than a reference value. ### Claim 6 (depends on 1) The imaging device according to claim 1, wherein the number of the plural phase planes is determined by measuring an electric field strength through application of the multiple scattering tracing algorithm while changing the number of phase planes, and is determined considering a calculation time according to the changed number. ### Claim 7 (depends on 1) The imaging device according to claim 1, wherein the reflection matrix measurer determines matrix components as light concentrated at each position on a surface of the target object, and measures the time-resolved reflection matrix determined as an intensity and phase of electric field measured on an output basis at each position of a camera placed on a conjugate image plane of the object surface, resulting in reflected light on an input basis. ### Claim 8 (depends on 1) The imaging device according to claim 1, wherein the light source makes the light incident as a point light on the target object and changes an incident location on the target object by changing a position of the point light, and the detector detects the changed detection pixel according to the changed incident location. ### Claim 9 (depends on 1) The imaging device according to claim 1, wherein the algorithm processor calculates an inverse matrix for each of an incident transmission matrix and reflection transmission matrix associated with phase values for the plural phase planes for the multiple scattering components of the scattering medium according to the multiple scattering tracing algorithm and phase values for plural points respectively constituting the plural phase planes, and reflects the calculated inverse matrix into the time-resolved reflection matrix to obtain an object reflection matrix for the target object. ### Claim 10 An imaging method, comprising: making, by a light source, light incident on a target object by passing through a scattering medium and multiple scattering components within the scattering medium; detecting, by a detector, light returned after the incident light transmits and reflects the multiple scattering components of the target object; measuring, by a reflection matrix measurer, a time-resolved reflection matrix reflecting multiple scattering trajectories based on the multiple scattering components based on the returning light; obtaining, by an algorithm processor, an incident transmission matrix and a reflection transmission matrix by numerically iteratively accessing a plurality of phase planes approximated from the scattering medium according to a multiple scattering tracing algorithm and obtaining an object reflection matrix by reflecting inverse matrices of the obtained incident transmission matrix and the obtained reflection transmission matrix into the measured time-resolved reflection matrix; and acquiring, by an image processor, an image in which multiple scattering distortion is corrected according to the multiple scattering trajectory based on the obtained object reflection matrix. ### Claim 11 (depends on 10) The imaging method according to claim 10, wherein the obtaining comprises performing numerical iterative access to each phase plane by multiplying an input or output end of the time-resolved reflection matrix by a spatial propagation matrix (Pk) corresponding to a distance to a k-th phase plane based on the multiple scattering tracing algorithm to obtain a plurality of incident transmission matrices and reflection transmission matrices corresponding to the k-th. ### Claim 12 (depends on 10) The imaging method according to claim 10, wherein the obtaining comprises obtaining, in consideration of a case where light is focused on two different points for a specific phase plane among the plural phase planes, a difference between phase delay values of the two points based on the multiple scattering tracing algorithm, and applying the obtained difference to an incident transmission matrix and reflection transmission matrix obtained for the specific phase plane. ### Claim 13 (depends on 10) The imaging method according to claim 10, wherein each of the plural phase planes calculates a transmission matrix in relation to the multiple scattering components inside the scattering medium, designs a first phase plane based on the calculated transmission matrix, and designs a second phase plane on the designed first phase plane based on the inverse transmission matrix of the calculated transmission matrix to be virtually located inside the scattering medium or to be located on the scattering medium. ### Claim 14 (depends on 10) The imaging method according to claim 10, wherein a location of the plural phase planes is determined by measuring an electric field intensity through application of the multiple scattering tracing algorithm while changing a distance from the target object, and is determined as a location where the measured electric field intensity is greater than a reference value, and the number of the plural phase planes is determined by measuring an electric field strength through application of the multiple scattering tracing algorithm while changing the number of phase planes, and is determined considering a calculation time according to the changed number.