# US 2025/0085696 A1 · Abnormality detection apparatus, method, and non-transitory computer readable medium > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 2025/0085696 A1 - Document ID: US20250085696A1 - Status: Published application - Kind: A1 - Application number: 18/814,837 - Filed: 2024-08-26 - Published: 2025-03-13 - Earliest claimed: 2023-09-12 - Assignees: Kabushiki Kaisha Toshiba - Applicants: Kabushiki Kaisha Toshiba - Inventors: Wataru WATANABE; Jumpei ANDO; Toshiyuki ONO - Web page: https://patentgrep.com/patent/US20250085696A1 ## CPC - G05B 19/4184: {characterised by fault tolerance, reliability of production system} - G05B: CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS (systems for controlling or regulating non-electric variables G05D; systems for regulating electric or magnetic variables G05F; control devices or systems insofar as characterised by mechanical features only G05G) ## Abstract According to one embodiment, an abnormality detection apparatus includes a processor. The processor acquires analysis data, the analysis data including at least operation data among the operation data and history data, the operation data being data of a manufacturing apparatus configured to intermittently process at least one product, the history data relating to a manufacturing history of the product processed by the manufacturing apparatus. The processor sets an operational state of the manufacturing apparatus in the operation data based on the acquired analysis data. The processor detects abnormality of the manufacturing apparatus based on the operation data and the set operational state. ## Claims ### Claim 1 An abnormality detection apparatus comprising a processor configured to: acquire analysis data, the analysis data including at least operation data among the operation data and history data, the operation data being data of a manufacturing apparatus configured to intermittently process at least one product, the history data relating to a manufacturing history of the product processed by the manufacturing apparatus; set an operational state of the manufacturing apparatus in the operation data based on the acquired analysis data; and detect abnormality of the manufacturing apparatus based on the operation data and the set operational state. ### Claim 2 (depends on 1) The abnormality detection apparatus according to claim 1, wherein the processor changes a method of detecting abnormality of the manufacturing apparatus according to the operational state. ### Claim 3 (depends on 1) The abnormality detection apparatus according to claim 1, wherein the processor sets a first state as the operational state for each time point at which a value of the operation data is equal to or above a threshold and sets a second state as the operational state for each time point at which a value of the operation data is less than the threshold, the second state differing from the first state. ### Claim 4 (depends on 1) The abnormality detection apparatus according to claim 1, wherein the history data includes a starting time and an ending time of processing performed on the product, and the processor sets a processing state as the operational state for each time point of the operation data between the starting time and the ending time and sets a non-processing state as the operational state for each time point of the operation data not between the starting time and the ending time. ### Claim 5 (depends on 4) The abnormality detection apparatus according to claim 4, wherein the history data includes a work content of the processing performed on the product, and the processor sets a predetermined state corresponding to the work content as the operational state for each time point of the operation data between the starting time and the ending time. ### Claim 6 (depends on 1) The abnormality detection apparatus according to claim 1, wherein the processor detects the abnormality of the manufacturing apparatus based on an order or a combination of the operational states set in the operation data. ### Claim 7 (depends on 6) The abnormality detection apparatus according to claim 6, wherein the processor sets a non-processing state in a first period of the operation data and sets a processing state in a second period following the first period, and increases a detection sensitivity to the abnormality of the manufacturing apparatus in the second period to be higher than a detection sensitivity to the abnormality of the manufacturing apparatus in the first period. ### Claim 8 (depends on 1) The abnormality detection apparatus according to claim 1, wherein the processor transforms the operation data and the set operational state based on an amount of processing on the product, and detects the abnormality of the manufacturing apparatus based on the transformed operation data and the transformed operational state. ### Claim 9 (depends on 8) The abnormality detection apparatus according to claim 8, wherein the processor sets a processing state for a predetermined period of the operation data as the operational state, and detects the abnormality of the manufacturing apparatus based on a comparison between the processing amount in the processing state and a length of the predetermined period. ### Claim 10 (depends on 9) The abnormality detection apparatus according to claim 9, wherein the processor normalizes the length of the predetermined period based on the processing amount, and detects the abnormality of the manufacturing apparatus based on a comparison between the processing amount and the normalized length of the predetermined period. ### Claim 11 An abnormality detection method comprising: acquiring analysis data, the analysis data including at least operation data among the operation data and history data, the operation data being data of a manufacturing apparatus configured to intermittently process at least one product, the history data relating to a manufacturing history of the product processed by the manufacturing apparatus; setting an operational state of the manufacturing apparatus in the operation data based on the acquired analysis data; and detecting abnormality of the manufacturing apparatus based on the operation data and the set operational state. ### Claim 12 A non-transitory computer readable medium including computer executable instructions, wherein the instructions, when executed by a processor, cause the processor to perform a method comprising: acquiring analysis data, the analysis data including at least operation data among the operation data and history data, the operation data being data of a manufacturing apparatus configured to intermittently process at least one product, the history data relating to a manufacturing history of the product processed by the manufacturing apparatus; setting an operational state of the manufacturing apparatus in the operation data based on the acquired analysis data; and detecting abnormality of the manufacturing apparatus based on the operation data and the set operational state.