Marking device tracking
AssigneeHewlett-Packard Development Company, L.P.
InventorsXavier OLIVA VENTAYOL, Lluis ABELLO ROSELLO, Borja NAVAS SANCHEZ, Ramon VIEDMA PONCE, Marina RAMON BORRAS
Life of this patent
Estimating the term…
Abstract
Examples relate to systems and methods for tracking a marking device, and for determining a set of locations for a measurement station. A method comprises receiving site layout information including information of a plurality of marking targets, defining potential optical obstructions, and determining a station placement list from a plurality of potential station placement locations.
Claims15
A computer-implemented method for determining a set of locations for placement of an optical measurement station for a marking device, comprising:
- receiving site layout information including location information of a plurality of marking targets on a site;
- defining potential optical obstructions to the optical measurement station in the site based on the site layout information;
- and
- determining a set of locations for placement of the optical measurement station on the site based on the plurality of marking targets and the defined potential optical obstructions.
A system comprising:
- a controller to:
- define a marking target list comprising a plurality of marking targets and their location information based on information of a site layout;
- define a plurality of station placement locations for potential placement of an optical measurement station;
- define potential optical obstructions to the optical measurement station based on the information of the site layout;
- determine, for each station placement location of the plurality of potential station placement locations, the marking targets from the marking target list visible from the station placement location and the total number of visible marking targets;
- and
- add a station location with a greatest number of visible marking targets to a station placement list.
A non-transitory machine-readable storage medium encoded with instructions which, when executed by a processor, cause the processor to:
- retrieve site layout information;
- define a marking target list comprising a plurality of marking targets and their location information based on the site layout plan;
- define a plurality of station placement locations on the site for the optical measurement station based on the site layout plan;
- define potential optical obstructions to the optical measurement station based on the site layout plan;
- determine, for each station placement location of the plurality of station placement locations, the marking targets from the marking target list visible from the placement location and the total number of marking targets that are visible from the station placement location;
- and
- add a station placement location with a greatest number of visible marking targets to a station placement list.
Dependencies are inferred from the claim text.