Spectroscopic analysis device and spectroscopic analysis method
AssigneeYokogawa Electric Corporation
InventorsRisa Hara, Toshiyuki Saruya, Kodai Murayama, Takeaki Ishii
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AssigneeYokogawa Electric Corporation
InventorsRisa Hara, Toshiyuki Saruya, Kodai Murayama, Takeaki Ishii
Estimating the term…
A spectroscopic analysis device (1) according to the present disclosure includes an irradiator (10) configured to irradiate irradiation light on an object to be measured, a light receiver (40) configured to receive reflected light based on the irradiation light from the object to be measured, and a controller (80) configured to analyze, based on the reflected light, an optical property of the object to be measured. The controller (80) is configured to acquire environment information on a measurement environment, including an observation window (W) that guides the irradiation light to the object to be measured, and to correct a parameter indicating the optical property according to the environment information.
A spectroscopic analysis device comprising:
A spectroscopic analysis method comprising:
Dependencies are inferred from the claim text.