Partial chain reconfiguration for test time reduction

A scan chain, comprising:

• a plurality of sequential segments;
• and
• a plurality of multiplexers, each multiplexer arranged at end points of each segment, wherein each pair of sequential segment shares a common multiplexer in between, each multiplexer configured to receive a select signal such that a relative position of each sequential segment is rearranged positionally in a rearranged scan chain,
• wherein a test pattern is fed to an input terminal of the rearranged scan chain and a test result is observed at an output of the rearranged scan chain, and
• wherein a fault condition is determined in the rearranged scan chain based on a comparison between the test result and an expected result.

A test system, comprising:

• a plurality of scan chains, wherein each alternate scan chain in the plurality of scan chains comprises:
• a plurality of sequential segments, and
• a plurality of multiplexers, each multiplexer arranged at end points of each segment, wherein each pair of sequential segment shares a common multiplexer in between, each multiplexer configured to receive a select signal such that a relative position of each sequential segment is rearranged positionally in a rearranged scan chain,
• wherein a test pattern is fed to an input terminal of the rearranged scan chain and a test result is observed at an output of the rearranged scan chain, and
• wherein a fault condition is determined in the rearranged scan chain based on a comparison between the test result and an expected result.