Method and system for matching calibrations of detectors in a detector array
AssigneeThermo EGS Gauging LLC
InventorCarter WATSON
Life of this patent
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AssigneeThermo EGS Gauging LLC
InventorCarter WATSON
Estimating the term…
A method and system for checking a gauge response is described. The method includes positioning samples with known profiles and uniform compositions between a radiation source and a subset of detectors in a detector array linearly arranged in a first direction. Sample signals are generated by irradiating the samples with radiation from the radiation source and detecting radiation transmitted through the samples and to the subset of detectors. The method includes inputting the sample signals into calibrations for each of the subset of detectors and each of the one or more samples, thereby determining values corresponding to each of the one or more samples and each of the subset of detectors. The method determines if the values corresponding to the one or more samples are consistent with the know values of the samples, and thereby provides an indication as to the state of calibration of the gauge.
A method for checking a gauge response comprising:
A system for checking a gauge response comprising:
Dependencies are inferred from the claim text.