Semiconductor memory device and controlling method thereof

A control method of a semiconductor device,

• wherein the semiconductor device comprises a memory unit, and the memory unit is a one-time programmable memory, and comprises:
• a data memory, written with replacement address information which is detected during a redundancy repair operation and corresponds to a defective memory cell of a memory cell array;
• and
• a check memory, written with check information which is detected during the redundant repair operation and corresponds to the replacement address information;
• wherein the data memory comprises a unit where the replacement address information can be written;
• wherein the control method of the semiconductor device comprises:
• an error detection and correction step, configured to perform error detection and correction on the replacement address information based on the check information;
• wherein when any of the replacement address information or the check information corresponding to the replacement address information is written into the unit and other replacement address information has been written into the unit, the error detection and correction unit does not perform the error detection and correction.