Correcting latch upset events in a trim register
AssigneeMicron Technology, Inc.
InventorsJohn M. Gonzales, Christopher G. Wieduwilt, Seth A. Eichmeyer, Matthew D. Jenkinson
Life of this patent
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Abstract
Apparatuses, systems, and methods for correcting latch upset events in a trim register are described. An example method includes sending a command, from a controller, to access at least one block of a plurality of blocks of a non-volatile memory. The method can further include receiving a failure message associated with reading the at least one block. The method can further include, in response to receiving the failure message, resetting trim data associated with the plurality of blocks.
Claims20
A method, comprising:
- sending a command, from a controller, to access at least one block of a plurality of blocks of a non-volatile memory device;
- receiving a failure message associated with reading the at least one block;
- and
- in response to receiving the failure message, resetting trim data associated with the plurality of blocks.
An apparatus, comprising:
- a non-volatile memory device comprising a plurality of blocks of memory;
- and
- a controller coupled to the non-volatile memory device and configured to:
- sending a command, from a controller, to access at least one block of a plurality of blocks of a non-volatile memory device;
- receiving a failure message associated with reading the at least one block from the non-volatile memory device, wherein a block status of the at least one block indicates the at least one block is a good block;
- in response to receiving the failure message, resetting trim data associated with the plurality of blocks;
- and
- resending the command to the non-volatile memory device.
An apparatus, comprising:
- a non-volatile memory device comprising a plurality of blocks of memory;
- and
- a controller coupled to the non-volatile memory device and configured to:
- send a command to access at least one block of the plurality of blocks of the non-volatile memory device;
- receive a failure message associated with reading the at least one block from the non-volatile memory device;
- in response to receiving the failure message, reset trim data stored in a trim register and associated with the plurality of blocks;
- and
- resending the command to read data from the at least one block.
Dependencies are inferred from the claim text.