Method, apparatus and system for use in manufacturing a material
AssigneeHenkel AG & Co. KGaA
InventorsNick TALKEN, Natarajan CHENNIMALAI KUMAR, Zack KISNER
Life of this patent
Estimating the term…
Loading patent…
AssigneeHenkel AG & Co. KGaA
InventorsNick TALKEN, Natarajan CHENNIMALAI KUMAR, Zack KISNER
Estimating the term…
A method for use in manufacturing a material having a value for a first measurable material property in a pre-determined range of values is disclosed, the method comprising obtaining a first set of input parameters; predicting or triggering predicting a value for the first measurable material property of a material based on the obtained first set of input parameters using a predictive model trained based on a stored plurality of data sets; and determining or triggering determining, at least based on the predicted value for the first measurable material property, a second set of input parameters for manufacturing a material. A corresponding method for use in manufacturing a material having a value for a first measurable material property in a pre-determined range of values comprising training the predictive model is disclosed. Additionally, a corresponding system, corresponding apparatuses and corresponding computer programs are disclosed.
A method for use in manufacturing a material having a value for a first measurable material property in a pre-determined range of values, the method comprising:
A method for use in manufacturing a material having a value for a first measurable material property in a pre-determined range of values, the method comprising:
21-24. (canceled)
Dependencies are inferred from the claim text.