Test device for optoelectronic integrated circuit

A test device for an optoelectronic integrated circuit, the test device electrically connected to test equipment, the optoelectronic integrated circuit comprising at least a light detection module and a light source module, and the test device comprising:

• a circuit board electrically connected to the test equipment;
• a connecting base arranged on the circuit board and comprising a carrier board and a frame, the carrier board comprising a carrier surface, the frame configured around the carrier surface, and the optoelectronic integrated circuit arranged on the carrier surface;
• a first light transmission component arranged on a side of the frame and comprising a first transmission portion located at a first vertical level with respect to the carrier surface;
• and
• a second light transmission component arranged on another side of the frame and comprising a second transmission portion located at a second vertical level with respect to the carrier surface, wherein a height of the second vertical level is different than that of the height of the first vertical level.