Offset calibration for signal rms measurement
AssigneeMACOM Technology Solutions Holdings, Inc.
InventorsJonathan Ugolini, Biagio Bisanti
Life of this patent
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Abstract
Offset calibration for signal rms measurement is provided. A method includes determining a first offset calibration of a first differential pair of a circuit. The first differential pair comprises a first transistor and a second transistor. The method also includes determining a second offset calibration of a second differential pair of the circuit. The second differential pair comprises a third transistor and a fourth transistor. Further, the method includes, based on the first offset calibration and the second offset calibration, determining a third offset calibration of a common mode.
Claims20
A method, comprising:
- determining a first offset calibration of a first differential pair of a circuit, the first differential pair comprises a first transistor and a second transistor;
- determining a second offset calibration of a second differential pair of the circuit, the second differential pair comprises a third transistor and a fourth transistor;
- and
- based on the first offset calibration and the second offset calibration, determining a third offset calibration of a common mode, wherein the common mode comprises a combination of the first differential pair and the second differential pair.
A method, comprising:
- calibrating a first differential pair of a peak detector circuit;
- calibrating a second differential pair of the peak detector circuit independent of the calibrating of the first differential pair;
- and
- calibrating a common mode of the peak detector circuit.
Dependencies are inferred from the claim text.