Mass spectrum data processing
AssigneeLuxembourg Institute of Science and Technology (List)
InventorsHung Quang HOANG, Rathaiah PURETI, Olivier BOUTON, Tom WIRTZ
Life of this patent
Estimating the term…
Loading patent…
AssigneeLuxembourg Institute of Science and Technology (List)
InventorsHung Quang HOANG, Rathaiah PURETI, Olivier BOUTON, Tom WIRTZ
Estimating the term…
A method for processing mass spectral data that has, for example, been obtained using a mass spectrometry device comprising deflection beams for scanning an ion beam over an area spanning the vertical direction of a microchannel plate focal plane detector, in order to increase the count rate of the detector. The method allows to efficiently combine ion counts that are detected on different areas of the focal plane detector, as a result of different deflection voltages being applied to the corresponding ion beams. Even though such beams also suffer unwanted deflections along the horizontal axis of the focal plane detector, the present method allows to re-align ion counts efficiently and to register them with accurate mass-to-charge ratios, which results in increased mass resolution power of the resulting combined mass spectrum.
A method for obtaining mass spectrum data of a sample, comprising the steps of:
Dependencies are inferred from the claim text.